IP Library Granted Patent US 12,456,702
Granted Patent B2
US 12,456,702 · App. 17/359,380 · Granted Oct 28, 2025

Device, method and system to mitigate stress on hybrid bonds in a multi-tier arrangement of chiplets

Inventors: Kimin Jun (Portland, OR); Feras Eid (Chandler, AZ); Adel Elsherbini (Tempe, AZ); Aleksandar Aleksov (Chandler, AZ); Shawna Liff (Scottsdale, AZ); Johanna Swan (Scottsdale, AZ); Julien Sebot (Portland, OR)
Assignee: Intel Corporation
H01L24/08H01L21/565H01L23/3128H01L23/562H01L24/80H01L25/0652H01L25/50H01L2224/08145H01L2224/80895H01L2224/80896H01L2225/06586H01L2924/351
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Quick Facts
Patent No.
US 12,456,702
App. No.
17/359,380
Granted
Oct 28, 2025
Kind
B2
Abstract

Techniques and mechanisms for mitigating stress on hybrid bonded interfaces in a multi-tier arrangement of integrated circuit (IC) dies. In an embodiment, first dies are bonded at a host die each via a respective one of first hybrid bond interfaces, wherein a second one or more dies are coupled to the host die each via a respective one of the first dies, and via a respective second hybrid bond interface. Stress at one of the hybrid bond interfaces is mitigated by properties of a first dielectric layer that extends to that hybrid bond interface. In another embodiment, stress at a given one of the hybrid bond interfaces is mitigated by properties of a dummy chip—or alternatively, properties of a patterned encapsulation structure—which is formed on the given hybrid bond interface.

Claims (32)

1. A packaged device comprising:

a host die;

a first plurality of dies each bonded at the host die via a respective hybrid bond interface of a first plurality of hybrid bond interfaces;

a second one or more dies each coupled to the host die via a respective one of the first plurality of dies, and via a respective hybrid bond interface of a second one or more hybrid bond interfaces, wherein a first tier of a multi-tier configuration of multiple dies comprises the first plurality of dies, and wherein a second tier of the multi-tier configuration comprises the second one or more dies;

an encapsulation structure comprising a first body of a first mold compound material, and a second body of a second mold compound material;

wherein:

the first mold compound material and the second mold compound material have different compositions;

the first body and the second body each extend in a region between a first die and a second die of the multiple dies;

the first tier comprises the first die and the second die; and

the first body and the second body each extend to both:

a first vertical level of the first plurality of hybrid bond interfaces; and

a second vertical level of the second one or more hybrid bond interfaces.

2. The packaged device of claim 1 , wherein, in the region, the first body adjoins each of two opposite sides of the second body.

3. The packaged device of claim 1 , wherein a contiguous portion of the encapsulation structure extends across the region to each of the first die and the second die.

4. The packaged device of claim 3 , wherein each of the first body and the second spans at least a respective 10% of a total horizontal distance in the region between the first die and the second die.

5. The packaged device of claim 1 , wherein the one of the first tier or the second tier further comprises a third die coupled to the host die via a respective hybrid bond interface;

wherein the encapsulation structure further comprises a third body of the second mold compound material;

wherein the first body further extends into a second region between the second die and the third die; and

wherein the third body extends into the second region.

6. The packaged device of claim 1 , wherein the other of the first tier or the second tier comprises a third die and a fourth die each coupled to the host die via a respective hybrid bond interface;

wherein the encapsulation structure further comprises a third body of the second mold compound material;

wherein the first body further extends into a second region between the third die and the fourth die; and

wherein the third body extends into the second region.

7. The packaged device of claim 1 , wherein a coefficient of thermal expansion (CTE) of the second mold compound material is less than 5 parts per million per degree Kelvin (ppm/° K).

8. The packaged device of claim 1 , wherein a Young's modulus of the second mold compound material is less than 100 megaPascals (MPa).

9. The packaged device of claim 1 , wherein:

the region is a first region;

the encapsulation structure further comprises a third body of the second mold compound material;

the first body and the third body each extend in a second region between a third die and a fourth die of the multiple dies;

the second tier comprises the third die and the fourth die;

the first body and the third body each extend to the second vertical level; and

the first body and the third body each span a vertical height of the second tier.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 10, 2021
From: JUN, KIMIN; EID, FERAS; ELSHERBINI, ADEL; ALEKSOV, ALEKSANDAR; LIFF, SHAWNA; SWAN, JOHANNA; SEBOT, JULIEN
To: INTEL CORPORATION
Reel/Frame 057468/0816 →
Continuity (1)
Related Publication 20220415837A1 · Dec 29, 2022
References Cited (4)
US 20170062383A1 · Yee · 2017 [cited by examiner]
US 20210035859A1 · Mehta · 2021 [cited by examiner]
DE 102020104147A1 · 2020 [cited by examiner]
WO WO2021081943A1 · 2021 [cited by examiner]