IP Library › Granted Patent US 12,463,078
Granted Patent B2
US 12,463,078 · App. 18/483,564 · Granted Nov 4, 2025

Micro-element, alignment system and assembling method

Inventor: Makoto Motoyoshi (Sendai, JP)
Assignee: TOHOKU-MICROTEC CO., LTD.
H01L21/6835H01L21/67144H01L24/63H01L24/65H01L24/73H01L24/80H01L24/95H01L2221/68309H01L2221/68313H01L2221/68354H01L2221/68368H01L2224/95144
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,463,078
App. No.
18/483,564
Granted
Nov 4, 2025
Kind
B2
Abstract

An alignment system arranges a plurality of micro-elements at positions on a mounting substrate, the micro-elements are equal in dimension and shape. The alignment system encompasses a rough alignment-apparatus including a picker having capturing-probes, each of which having a capturing-face and a magnetic-force applying portion provided on the capturing-face, and a base-plate on which the capturing-probes are arrayed with an array-pattern. In the alignment system, each of the magnetic-force applying portions applies magnetic lines on the magnetic-force receptor to capture one of the micro-elements.

Claims (11)

1 . An alignment system configured to arrange a plurality of micro-elements at scheduled positions on a mounting substrate, each of the micro-elements including a functional face, a bottom face parallel to the functional face, a plurality of circumscribing- ridges connecting the functional and bottom faces, and a magnetic-force receptor allocated at a limited site on the functional face, the micro-elements are equal in dimension and shape, the system comprising a rough alignment-apparatus including a picker having:

a plurality of capturing-probes, each of which having a capturing-face made of flat plane and a magnetic-force applying portion provided on the capturing-face; and

a base-plate on which the plurality of capturing-probes is arrayed with a predetermined array-pattern,

wherein each of the magnetic-force applying portions applies magnetic lines on the magnetic-force receptor to capture one of the micro-elements, respectively, and positions of a particular circumscribing-ridge elected among the plurality of circumscribing-ridges and the functional face are identified by the magnetic-force receptor.

2 . The alignment systems of claim 1 , wherein a maximum diagonal-length on the functional face is one mm or less.

3 . The alignment system of claim 2 , wherein the functional face is assigned as “a first functional face”, the bottom face is assigned as “a first bottom face” the micro-elements is assigned as “a first micro-elements”, the capturing-face is assigned as “a first capturing-face”, the magnetic-force applying portion is assigned as “a first magnetic-force applying portion”, the capturing-probe is assigned as “a first capturing-probe”, the array-pattern is assigned as “a first array-pattern”, the base-plate is assigned as “a first base-plate-plate”, the picker is assigned as “a first picker”, and the magnetic-force receptor is assigned as “a first magnetic-force receptor”, and the rough alignment-apparatus further including a second picker having:

a plurality of second capturing-probes, each of which is equal in dimension and shape to the first capturing-probes, and each of which having a second capturing-face made of flat plane, and a second magnetic-force applying portion is arranged on each of the second capturing-faces, and

a second base-plate-plate, on which the plurality of second capturing- probes is arrayed in a second array-pattern that is defined related to the first array-pattern on the mounting substrate,

wherein each of the second magnetic-force applying portions applies second magnetic lines to a second magnetic-force receptor provided on a second functional face defined on one of second micro-elements, respectively, under a same rule as the first magnetic-force receptor and captures the one of the second micro-elements.

4 . The alignment system of claim 3 , further comprising a precise alignment-apparatus having a precise alignment-tray with an array of a plurality of concaves to which the first and second array-pattern is assigned,

wherein each of the plurality of concaves has inscribed angles which are equal to an angle of a first ridge-to-be-mated selected from a plurality of circumscribing-ridges connecting the first functional and bottom faces, and are equal to an angle of a second ridge-to-be-mated selected from the plurality of circumscribing-ridges connecting the second functional and bottom faces, which are same angle as the first ridge-to-be-mated, respectively.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 10, 2023
From: MOTOYOSHI, MAKOTO
To: TOHOKU-MICROTEC CO., LTD.
Reel/Frame 065166/0382 →
Continuity (2)
Continuation PCTJP2023020603 · Jun 2, 2023
Related Publication 20240404864A1 · Dec 5, 2024
References Cited (18)
US 8138868B2 · Arnold · 2012 [cited by applicant]
US 8334152B2 · Speier · 2012 [cited by examiner]
US 8518204B2 · Hu · 2013 [cited by examiner]
US 8586410B2 · Arnold et al. · 2013 [cited by applicant]
US 10147622B2 · Wu · 2018 [cited by examiner]
US 20100015730A1 · Lian · 2010 [cited by examiner]
US 20120313236A1 · Wakiyama et al. · 2012 [cited by applicant]
US 20170148650A1 · Wu et al. · 2017 [cited by applicant]
US 20170330857A1 · Zou · 2017 [cited by examiner]
US 20220384225A1 · Motoyoshi · 2022 [cited by applicant]
US 20230178280A1 · Kim · 2023 [cited by examiner]
US 20240381531A1 · Chaji · 2024 [cited by examiner]
JP 2004340696A · 2004 [cited by applicant]
JP 2012256737A · 2012 [cited by applicant]
KR 1020220077522A · 2022 [cited by applicant]
WO 2022249431A1 · 2002 [cited by applicant]
Yifan Wu, et al., Full Color-Realization of Micro-LED Display, Nanomaterials, Oct. 2020, pp. 1-33, vol. 2482, Basel, Switzerland. [cited by applicant]
Extended European Search Report (EESR) dated Feb. 10, 2025 for EP 23806162.6 (12 pgs.). [cited by applicant]