Valid signal for latency sensitive die-to-die (D2D) interconnects
Embodiments herein relate to a die of a multi-die package, wherein the die is coupled with another die via a die-to-die (D2D) interconnect link. The die may transmit a data signal to the other die via a data lane of the D2D interconnect link. The die may further transmit, concurrently with the data signal, a valid signal to the other die via a valid lane of the D2D interconnect link. The valid signal may change logical state at least once during the transmission of the data signal. Other embodiments may be described and claimed.
1 . A die for use in a multi-die package, wherein the die comprises:
physical layer (PHY) electrical circuitry to transmit data over a die-to-die (D2D) interconnect link, wherein the interconnect link includes a sideband and a mainband, and wherein the mainband includes a differential clock lane, a valid lane, and a cluster of data lanes; and
PHY logic coupled to the PHY electrical circuitry, the PHY logic to:
transmit, via the PHY electrical circuitry, an 8 unit interval (8-UI) data signal on a data lane of the cluster of data lanes; and
transmit, via the PHY electrical circuitry concurrently with transmission of the data signal, a valid signal on the valid lane, wherein the valid signal is to frame a location of the 8-UI data signal, and wherein the valid signal is further to indicate data related to the die based on at least one change in logical state of the valid signal during the 8-UI data signal.
2 . The die of claim 1 , wherein the valid signal is at a first logical state during transmission of one UI of the 8-UI signal, and the valid signal is at a second logical state during transmission of another UI of the 8-UI signal.
3 . The die of claim 2 , wherein the first logical state is a logical “1” and the second logical state is a logical “0”.
4 . The die of claim 2 , wherein the first logical state is a logical “0” state and the second logical state is a logical “1”.
5 . The die of claim 1 , wherein the cluster of data lanes includes 16 or 64 data lanes.
6 . The die of claim 1 , wherein the data related to the die includes an indication of error detection related to data received by the die.
7 . The die of claim 1 , wherein the data related to the die includes an indication of a credit release by the die.
8 . The die of claim 1 , wherein the die is a retimer.
9 . The die of claim 8 , wherein the retimer is to communicatively couple with a second die of the multi-die package via a first protocol, and the retimer is to communicatively coupled with a third die of a different package via a second protocol.
10 . A die for use in a multi-die package, wherein the die comprises:
physical layer (PHY) electrical circuitry to transmit data over a die-to-die (D2D) interconnect link, wherein the interconnect link includes a sideband and a mainband, and wherein the mainband includes a differential clock lane, a valid lane, and a cluster of data lanes; and
PHY logic coupled to the PHY electrical circuitry, the PHY logic to:
transmit, via the PHY electrical circuitry, an 8 unit interval (8-UI) data signal on a data lane of the cluster of data lanes; and
transmit, via the PHY electrical circuitry concurrently with the transmission of the UI data signal, a valid signal on the valid lane, wherein the valid signal changes logical state at least once during transmission of the 8-UI data signal.
11 . The die of claim 10 , wherein the valid signal is in a logical “1” state for four UIs of the 8-UI data signal, and the valid signal is in a logical “0” state for another four UIs of the 8-UI data signal.
12 . The die of claim 11 , wherein the valid signal is in the logical “1” state for the first four UIs of the 8-UI data signal, and the valid signal is in the logical “0” state for a second four UIs of the 8-UI data signal.
13 . The die of claim 11 , wherein the valid signal is in the logical “1” state for a first, second, fifth, and sixth UIs of the 8-UI data signal, and the valid signal is in the logical “0” state for a third, fourth, seventh, and eighth UIs of the 8-UI data signal.
14 . The die of claim 10 , wherein a change in logical state is based on data related to the die that is being carried by the valid signal.
15 . The die of claim 14 , wherein the data related to the die includes an indication of error detection related to data received by the die.
16 . The die of claim 14 , wherein the data related to the die includes an indication of a credit release by the die.
17 . The die of claim 10 , wherein the valid signal is to frame a location of the 8-UI data signal based on a change in logical state of the valid signal during or after transmission of an eighth UI of the 8-UI data signal.
18 . The die of claim 10 , wherein the cluster of data lanes includes 16 or 64 data lanes.
19 . The die of claim 10 , wherein the die is a retimer.
20 . The die of claim 19 , wherein the retimer is to communicatively couple with a second die of the multi-die package via a first protocol, and the retimer is to communicatively coupled with a third die of a different package via a second protocol.
21 . A method to be performed by a die of a multi-die package, wherein the method comprises:
transmitting an 8 unit interval (8-UI) data signal on a data lane of a cluster of data lanes of a die-to-die (D2D) interconnect link, wherein the interconnect link includes a sideband and a mainband, and wherein the mainband includes a differential clock lane, a valid lane, and the cluster of data lanes; and
transmitting, concurrently with transmission of the data signal, a valid signal on the valid lane, wherein the valid signal is to frame a location of the 8-UI data signal based on a first change in logical state of the valid signal during or after transmission of a last UI of the 8-UI data signal, and wherein the valid signal is further to indicate data related to the die based on a second change in logical state of the valid signal after or during transmission of a fourth UI of the 8-UI data signal.