Illumination optical system, exposure apparatus, irradiation method, and component manufacturing method
An illumination optical system that irradiates a target object with light from a light source unit includes an integrator optical system, a condenser lens, and a bandpass filter. The integrator optical system is disposed on an optical path of the light emitted from the light source unit and uniformizes an illuminance distribution of the light with which the target object is to be irradiated. The condenser lens includes a plurality of lenses and irradiates the target object with the light emitted from the integrator optical system. The bandpass filter is disposed between any two of the plurality of lenses included in the condenser lens.
1 . An illumination optical system that irradiates a target object with light from a light source unit, comprising:
an integrator optical system that is disposed on an optical path of the light emitted from the light source unit and uniformizes an illuminance distribution of the light with which the target object is to be irradiated;
a condenser lens that includes a plurality of lenses and irradiates the target object with the light emitted from the integrator optical system; and
a bandpass filter that is disposed between any two of the plurality of lenses included in the condenser lens.
2 . The illumination optical system according to claim 1 , further comprising:
a beam splitter that is disposed on an optical path from the integrator optical system to the condenser lens and splits the light emitted from the integrator optical system into first split light and second split light, the first split light traveling toward the condenser lens along the optical path, the second split light traveling in a direction deviated from the optical path; and
a sensor unit that is disposed at a position on which the second split light is to be incident, and detects a state of the light.
3 . The illumination optical system according to claim 2 , further comprising
a second bandpass filter that is disposed on a light-incident side of the sensor unit when the bandpass filter is used as a first bandpass filter, the second bandpass filter having a filter characteristic identical to a filter characteristic of the first bandpass filter.
4 . The illumination optical system according to claim 3 , wherein
the bandpass filter has a half bandwidth of 10 nm or less.
5 . The illumination optical system according to claim 2 , wherein
the bandpass filter has a half bandwidth of 10 nm or less.
6 . The illumination optical system according to claim 1 , wherein
the bandpass filter has a half bandwidth of 10 nm or less.
7 . An exposure apparatus, comprising
the illumination optical system according to claim 1 , wherein
the illumination optical system is configured to irradiate an exposure mask with light.
8 . The exposure apparatus according to claim 7 , further comprising
a masking blade that is disposed within a range of 15 mm with respect to the exposure mask, wherein
the exposure apparatus is configured such that the light for irradiation is partially blocked by the masking blade.
9 . The exposure apparatus according to claim 8 , further comprising
a projection optical system that projects a pattern of the exposure mask irradiated with the light onto an exposure target object.
10 . The exposure apparatus according to claim 7 , further comprising
a projection optical system that projects a pattern of the exposure mask irradiated with the light onto an exposure target object.
11 . An exposure apparatus, comprising:
the illumination optical system according to claim 1 ;
a masking blade; and
a masking blade projection optical system that projects the light emitted through an aperture of the masking blade onto an exposure mask, wherein
the illumination optical system is configured to irradiate the aperture of the masking blade with the light.
12 . The exposure apparatus according to claim 11 , further comprising
a projection optical system that projects a pattern of the exposure mask irradiated with the light onto an exposure target object.
13 . A component manufacturing method, comprising
performing light irradiation by using an apparatus including the illumination optical system according to claim 1 .
14 . The component manufacturing method according to claim 13 , wherein
the apparatus including the illumination optical system is an exposure apparatus, and
the performing light irradiation includes projecting a pattern of an exposure mask.
15 . An irradiation method of irradiating a target object with light, comprising:
emitting light from a light source unit;
emitting, by an integrator optical system disposed on an optical path of the light emitted from the light source unit, the light toward a condenser lens including a plurality of lenses, in a manner that an illuminance distribution of the light with which the target object is to be irradiated is uniformized; and
irradiating, by the condenser lens, the target object with light passing through a bandpass filter disposed between any two of the plurality of lenses.