IP Library › Granted Patent US 12,482,775
Granted Patent B2
US 12,482,775 · App. 17/818,003 · Granted Nov 25, 2025

Semiconductor structure

Inventors: Sheng-Fu Huang (New Taipei, TW); Shing-Yih Shih (New Taipei, TW)
Assignee: NANYA TECHNOLOGY CORPORATION
H01L24/08H01L24/05H01L25/0657H01L2224/0235H01L2224/0236H01L2224/02371H01L2224/02373H01L2224/02381H01L2224/024H01L2224/05687H01L2224/08145H01L2224/08146H01L2225/06524H01L2225/06541H01L2924/3511
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Quick Facts
Patent No.
US 12,482,775
App. No.
17/818,003
Granted
Nov 25, 2025
Kind
B2
Abstract

A semiconductor structure includes a first chip and a second chip bonded to the first chip. The first chip includes a first semiconductor substrate, a first multi-level interconnect structure over the first semiconductor substrate, a first redistribution layer (RDL) over a conductive line of the first multi-level interconnect structure, a compact layer over the first RDL and the first multi-level interconnect structure, a cap layer over the compact layer, and a metal pad on the first RDL. The second chip includes a second semiconductor substrate, a second multi-level interconnect structure over the second semiconductor substrate, and conductive structure extending from the second multi-level interconnect structure to the metal pad.

Claims (37)

1 . A semiconductor structure, comprising:

a first chip comprising:

a first semiconductor substrate;

a first multi-level interconnect structure over the first semiconductor substrate, the first multi-level interconnect structure comprising a conductive line;

a first redistribution layer (RDL) over the conductive line of the first multi-level interconnect structure;

a compact layer over the first RDL and the first multi-level interconnect structure, wherein the compact layer has a portion within the first multi-level interconnect structure;

a cap layer over the compact layer; and

a metal pad on the first RDL; and

a second chip bonded to the first chip, the second chip comprising:

a second semiconductor substrate;

a second multi-level interconnect structure over the second semiconductor substrate; and

a conductive structure extending from the second multi-level interconnect structure to the metal pad.

2 . The semiconductor structure of claim 1 , wherein the compact layer is made of polymer or glass.

3 . The semiconductor structure of claim 1 , wherein the compact layer has dopants containing nitrogen, hydrogen or oxygen.

4 . The semiconductor structure of claim 1 , wherein the cap layer is in contact with the compact layer.

5 . The semiconductor structure of claim 1 , wherein the compact layer is in contact with the metal pad.

6 . The semiconductor structure of claim 1 , wherein the first chip further comprises a dielectric layer between the compact layer and the first multi-level interconnect structure.

7 . The semiconductor structure of claim 1 , wherein the cap layer is selected from the group consisting of silicon, carbon, oxygen, and nitrogen.

8 . The semiconductor structure of claim 1 , wherein the first RDL comprises:

a top portion;

a bottom portion; and

a neck portion between the top portion and the bottom portion, wherein the top portion is thicker than the bottom portion.

9 . The semiconductor structure of claim 8 , wherein the neck portion and the bottom portion of the first RDL are within the first multi-level interconnect structure.

10 . The semiconductor structure of claim 1 , wherein the second chip comprises a second RDL over the second multi-level interconnect structure.

11 . The semiconductor structure of claim 1 , wherein the second chip comprises a dielectric layer between the second semiconductor substrate and the cap layer, wherein the dielectric layer and the cap layer include a same material.

12 . A semiconductor structure, comprising:

a first chip comprising:

a first semiconductor substrate;

a first multi-level interconnect structure over the first semiconductor substrate, the first multi-level interconnect structure comprising a conductive line;

a first redistribution layer (RDL) over the conductive line of the first multi-level interconnect structure;

a compact layer over the first RDL and the first multi-level interconnect structure;

a cap layer over the compact layer; and

a metal pad on the first RDL, wherein the compact layer is in contact with the metal pad; and

a second chip bonded to the first chip, the second chip comprising:

a second semiconductor substrate;

a second multi-level interconnect structure over the second semiconductor substrate; and

a conductive structure extending from the second multi-level interconnect structure to the metal pad.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 8, 2022
From: HUANG, SHENG-FU; SHIH, SHING-YIH
To: NANYA TECHNOLOGY CORPORATION
Reel/Frame 060748/0972 →
Continuity (1)
Related Publication 20240047395A1 · Feb 8, 2024
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