IP Library › Granted Patent US 12,499,963
Granted Patent B2
US 12,499,963 · App. 18/584,725 · Granted Dec 16, 2025

Semiconductor integrated circuit device with a ring oscillator having a plurality of stages of delay circuits for measuring the delay characteristic of a transistor

Inventor: Hideo Akiyoshi (Yokohama, JP)
Assignee: Socionext Inc.
G11C29/50G11C11/412H10B10/12G11C2029/5002
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,499,963
App. No.
18/584,725
Granted
Dec 16, 2025
Kind
B2
Abstract

A semiconductor integrated circuit device includes a ring oscillator having a plurality of stages of delay circuits. In each of the delay circuits, when the signal at the input terminal makes a first transition, the signal at the output terminal transitions in response to the operation of a first transistor that corresponds to a transistor in an SRAM cell. When the signal at the input terminal makes a second transition, the first transistor is electrically isolated from the output terminal, and the signal at the output terminal transitions in response to the operation of a second transistor.

Claims (61)

1 . A semiconductor integrated circuit device, comprising:

an SRAM circuit block including an SRAM cell; and

a ring oscillator having delay circuits arranged in a plurality of stages,

wherein

each of the delay circuits includes

an input terminal,

an output terminal,

a first transistor of a first conductivity type, the first transistor being a same in size as a transistor of the first conductivity type in the SRAM cell, and having a gate connected to the input terminal and a source connected to a first power supply,

a second transistor of a second conductivity type, having a gate connected to the input terminal, a source connected to a second power supply, and a drain connected to the output terminal, and

a third transistor of the first conductivity type, having a gate connected to the input terminal, a source connected to a drain of the first transistor, and a drain connected to the output terminal,

when a signal sent to the input terminal makes a first transition, the first and third transistors become conductive while the second transistor becomes nonconductive, and with the conduction of the third transistor, the drain of the first transistor is electrically connected to the output terminal, so that a signal at the output terminal transitions in response to an operation of the first transistor, and

when the signal sent to the input terminal makes a second transition opposite to the first transition, the first and third transistors become nonconductive while the second transistor becomes conductive, and with the non-conduction of the third transistor, the drain of the first transistor is electrically isolated from the output terminal, so that the signal at the output terminal transitions in response to an operation of the second transistor.

2 . The semiconductor integrated circuit device of claim 1 , wherein

the first conductivity type is an n-type and the second conductivity type is a p-type,

the first power supply is a low-voltage side power supply and the second power supply is a high-voltage side power supply, and

the first transition is a transition from a low level to a high level and the second transition is a transition from a high level to a low level.

3 . The semiconductor integrated circuit device of claim 1 , wherein

the first conductivity type is a p-type and the second conductivity type is an n-type,

the first power supply is a high-voltage side power supply and the second power supply is a low-voltage side power supply, and

the first transition is a transition from a high level to a low level and the second transition is a transition from a low level to a high level.

4 . The semiconductor integrated circuit device of claim 1 , wherein

the first transistor is the same in size as the transistor in the SRAM cell.

5 . A semiconductor integrated circuit device, comprising:

a ring oscillator having delay circuits arranged in a plurality of stages,

wherein

each of the delay circuits includes

an input terminal,

an output terminal,

a first transistor of a first conductivity type, having a gate connected to the input terminal and a source connected to a first power supply,

a second transistor of a second conductivity type, having a gate connected to the input terminal, a source connected to a second power supply, and a drain connected to the output terminal, and

a third transistor of the first conductivity type, having a gate connected to the input terminal, a source connected to a drain of the first transistor, and a drain connected to the output terminal,

when a signal sent to the input terminal makes a first transition, the first and third transistors become conductive while the second transistor becomes nonconductive, and with the conduction of the third transistor, the drain of the first transistor is electrically connected to the output terminal, so that a signal at the output terminal transitions in response to an operation of the first transistor, and

when the signal sent to the input terminal makes a second transition opposite to the first transition, the first and third transistors become nonconductive while the second transistor becomes conductive, and with the non-conduction of the third transistor, the drain of the first transistor is electrically isolated from the output terminal, so that the signal at the output terminal transitions in response to an operation of the second transistor.

6 . The semiconductor integrated circuit device of claim 5 , wherein

the first conductivity type is an n-type and the second conductivity type is a p-type,

the first power supply is a low-voltage side power supply and the second power supply is a high-voltage side power supply, and

the first transition is a transition from a low level to a high level and the second transition is a transition from a high level to a low level.

7 . The semiconductor integrated circuit device of claim 5 , wherein

the first conductivity type is a p-type and the second conductivity type is an n-type,

the first power supply is a high-voltage side power supply and the second power supply is a low-voltage side power supply, and

the first transition is a transition from a high level to a low level and the second transition is a transition from a low level to a high level.

8 . A semiconductor integrated circuit device, comprising:

a first ring oscillator having first delay circuits arranged in a plurality of stages; and

a second ring oscillator having second delay circuits arranged in a plurality of stages,

wherein

each of the first delay circuits includes

a first input terminal,

a first output terminal,

a first transistor of a first conductivity type, having a gate connected to the first input terminal and a source connected to a first power supply,

a second transistor of a second conductivity type, having a gate connected to the first input terminal, a source connected to a second power supply, and a drain connected to the first output terminal, and

a third transistor of the first conductivity type, having a gate connected to the first input terminal, a source connected to a drain of the first transistor, and a drain connected to the first output terminal,

when a signal sent to the first input terminal makes a first transition, the first and third transistors become conductive while the second transistor becomes nonconductive, and with the conduction of the third transistor, the drain of the first transistor is electrically connected to the first output terminal, so that a signal at the first output terminal transitions in response to an operation of the first transistor,

when the signal sent to the first input terminal makes a second transition opposite to the first transition, the first and third transistors become nonconductive while the second transistor becomes conductive, and with the non-conduction of the third transistor, the drain of the first transistor is electrically isolated from the first output terminal, so that the signal at the first output terminal transitions in response to an operation of the second transistor,

each of the second delay circuits includes

a second input terminal,

a second output terminal,

a fourth transistor of the second conductivity type, having a gate connected to the second input terminal and a source connected to the second power supply,

a fifth transistor of the first conductivity type, having a gate connected to the second input terminal, a source connected to the first power supply, and a drain connected to the second output terminal, and

a sixth transistor of the second conductivity type, having a gate connected to the second input terminal, a source connected to a drain of the fourth transistor, and a drain connected to the second output terminal,

when a signal sent to the second input terminal makes the second transition, the fourth and sixth transistors become conductive while the fifth transistor becomes nonconductive, and with the conduction of the sixth transistor, the drain of the fourth transistor is electrically connected to the second output terminal, so that a signal at the second output terminal transitions in response to an operation of the fourth transistor, and

when the signal sent to the second input terminal makes the first transition, the fourth and sixth transistors become nonconductive while the fifth transistor becomes conductive, and with the non-conduction of the sixth transistor, the drain of the fourth transistor is electrically isolated from the second output terminal, so that the signal at the second output terminal transitions in response to an operation of the fifth transistor.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 23, 2024
From: AKIYOSHI, HIDEO
To: SOCIONEXT INC.
Reel/Frame 066538/0677 →
Continuity (2)
Continuation PCTJP2021031085 · Aug 25, 2021
Related Publication 20240233854A1 · Jul 11, 2024
References Cited (17)
US 5563542A · Watarai · 1996 [cited by examiner]
US 8004878B2 · Asayama · 2011 [cited by examiner]
US 9160315B2 · Moriwaki · 2015 [cited by examiner]
US 9240247B2 · Tsuruta · 2016 [cited by examiner]
US 10964379B2 · Herberholz · 2021 [cited by examiner]
US 20010054921A1 · Akiyoshi · 2001 [cited by examiner]
US 20030234671A1 · Akiyoshi · 2003 [cited by examiner]
US 20080211556A1 · Masuo · 2008 [cited by examiner]
US 20090135662A1 · Akiyoshi · 2009 [cited by examiner]
US 20140002199A1 · Tsuruta · 2014 [cited by applicant]
US 20140210561A1 · Moriwaki · 2014 [cited by applicant]
DE 10046413A1 · 2001 [cited by examiner]
EP 0704972A2 · 1996 [cited by examiner]
JP 2014010874A · 2014 [cited by applicant]
JP 2014150353A · 2014 [cited by applicant]
Mureddu, et al., “Experimental Study of Locking Phenomena on Oscillating Rings Implemented in Logic Devices”; IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 66, No. 7, pp. 2560-2571, Jul. 2019. (Year:… [cited by examiner]
International Search Report dated Oct. 5, 2021 issued in International Patent Application No. PCT/JP2021/031085, with English translation. [cited by applicant]