Method for autonomously applying a dangling bond pattern to a substrate
A method for autonomously applying a dangling bond pattern to a substrate for atom scale device fabrication includes inputting the pattern, initiating a patterning process, scanning the substrate using a scanning probe microscope (SPM) to generate an SPM image of the substrate, feeding the SPM image into a trained convolution neural network (CNN), analyzing the SPM image using the CNN to identify substrate defects, determining a defect free substrate area for pattern application; and applying the pattern to the substrate in that area. An atom scale electronic component includes functional patches on a substrate and wires electrically connecting the functional patches. Training a CNN includes recording a Scanning Tunneling Microscope (STM) image of the substrate, extracting images of defects from the STM image, labeling pixel-wise the defect images, and feeding the extracted and labeled images of defects into a CNN to train the CNN for semantic segmentation.
1 . A method for autonomously applying a dangling bond pattern to a substrate for atom scale device fabrication:
inputting the pattern to be applied to the substrate;
initiating a patterning process;
scanning the substrate using a scanning probe microscope (SPM) to generate an SPM image of the substrate;
feeding the SPM image into a trained convolution neural network (CNN) for semantic segmentation, wherein the CNN has been trained using images including a suitable region, a charged state defect region, and a neutral charge state defect region;
analyzing the SPM image using the CNN to identify defects on the substrate;
determining an area capable of supporting a pattern to be applied to the substrate as a suitable area on the substrate for application of the pattern; and
applying the pattern of dangling bonds to the substrate in the suitable area.
2 . The method of claim 1 wherein the substrate is hydrogen-terminated Si (100) surface.
3 . The method of claim 1 wherein the SPM image has a resolution of 10 pixels/nm.
4 . The method of claim 1 wherein identifying defects on the substrate includes characterizing defects on the substrate.
5 . The method of claim 1 wherein identifying defects on the substrate includes locating defects on the substrate.
6 . The method of claim 1 wherein analyzing the SPM image includes pixelating the image.