IP Library Granted Patent US 12,519,035
Granted Patent B2
US 12,519,035 · App. 17/466,417 · Granted Jan 6, 2026

Semiconductor device and method of making

Inventors: Chih-Yu Lai (Hsinchu, TW); Chih-Liang Chen (Hsinchu, TW); Chi-Yu Lu (Hsinchu, TW); Shang-Hsuan Chiu (Hsinchu, TW)
Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
H01L23/481H01L21/76898H01L25/0657H10D88/00H10D89/10H01L2225/06544
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Quick Facts
Patent No.
US 12,519,035
App. No.
17/466,417
Granted
Jan 6, 2026
Kind
B2
Abstract

A semiconductor device includes a substrate, a first cell having a first functionality, and a second cell having a second functionality. The first cell includes a first portion on a first side of the substrate, wherein the first portion includes a first conductive element; a second portion on a second side of the substrate, wherein the second portion includes a second conductive element; and a first conductive via extending through the substrate and electrically connecting the first conductive element to the second conductive element. The second cell includes a third portion on the first side of the substrate, wherein the third portion includes a third conductive element; a fourth portion on the second side of the substrate, wherein the fourth portion includes a fourth conductive element; and a second conductive via extending through the substrate and electrically connecting the third conductive element to the fourth conductive element.

Claims (34)

1 . A semiconductor device comprising:

a semiconductor substrate;

a first cell, wherein the first cell has a first functionality, and the first cell comprises:

a first portion on a first side of the semiconductor substrate, wherein the first portion comprises a first conductive element, and the first conductive element comprises a gate electrode or a source/drain electrode;

a second portion on a second side of the semiconductor substrate opposite the first side, wherein the second portion comprises a second conductive element; and

a first conductive via extending through the semiconductor substrate, wherein the first conductive via electrically connects the first conductive element to the second conductive element; and

a second cell, wherein the second cell has a second functionality, and the second cell comprises:

a third portion on the first side of the semiconductor substrate, wherein the third portion comprises a third conductive element;

a fourth portion on the second side of the semiconductor substrate, wherein the fourth portion comprises a fourth conductive element; and

a second conductive via extending through the semiconductor substrate, wherein the second conductive via electrically connects the third conductive element to the fourth conductive element.

2 . The semiconductor device of claim 1 , wherein the first cell has a first layout type, and the second cell has a second layout type.

3 . The semiconductor device of claim 1 , wherein the first portion has a first layout type, and the second portion has a second layout type.

4 . The semiconductor device of claim 1 , wherein the first cell is a horizontal stacked cell, including two signal lines, and having a first channel width, and the second cell is vertical mirrored, includes 4 signal lines, and has a small second channel width less than the first channel width.

5 . The semiconductor device of claim 1 , further comprising a third cell, wherein the third cell comprises:

a fifth portion on the first side of the semiconductor substrate, wherein the fifth portion comprises a fifth conductive element;

a sixth portion on the second side of the semiconductor substrate, wherein the sixth portion comprises a sixth conductive element; and

a third conductive via extending through the semiconductor substrate, wherein the third conductive via electrically connects the fifth conductive element to the sixth conductive element.

6 . The semiconductor device of claim 5 , wherein the first cell has a first layout type, the second cell has a second layout type, the third cell has a third layout type, and the third layout type is different from at least one of the first layout type or the second layout type.

7 . The semiconductor device of claim 6 , wherein the first cell is spaced from the second cell in a first direction, the first cell is spaced from the third cell in a second direction perpendicular to the first direction, and the third layout type is different from the first layout type.

8 . The semiconductor device of claim 6 , wherein the second cell is spaced from the first cell in a first direction, the second cell is spaced from the third cell in a second direction perpendicular to the first direction, and the third layout type is different from the second layout type.

9 . The semiconductor device of claim 1 , wherein the first conductive element includes a first source/drain (S/D) electrode, and the second conductive element includes a second S/D electrode.

10 . The semiconductor device of claim 1 , wherein the first conductive element includes a first gate electrode, and the second conductive element includes a second gate electrode.

11 . A semiconductor device comprising:

a semiconductor substrate;

a first cell, wherein the first cell has a first threshold voltage, and the first cell comprises:

a first conductive element on a first side of the semiconductor substrate;

a second conductive element on a second side of the semiconductor substrate opposite the first side; and

a first conductive via extending through the semiconductor substrate, wherein the first conductive via electrically connects the first conductive element to the second conductive element; and

a second cell, wherein the second cell has a second threshold voltage, and the second cell comprises:

a third conductive element on the first side of the semiconductor substrate;

a fourth conductive element on the second side of the semiconductor substrate; and

a second conductive via extending through the semiconductor substrate, wherein the second conductive via electrically connects the third conductive element to the fourth conductive element.

12 . The semiconductor device of claim 11 , wherein the first conductive element comprises a gate electrode.

13 . The semiconductor device of claim 11 , wherein the first conductive element comprises a source/drain electrode.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 3, 2021
From: LAI, CHIH-YU; CHEN, CHIH-LIANG; LU, CHI-YU; CHIU, SHANG
To: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
Reel/Frame 057383/0286 →
Continuity (2)
Provisional Application 63219633 · Jul 8, 2021
Related Publication 20230008866A1 · Jan 12, 2023
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