IP Library › Granted Patent US 12,542,260
Granted Patent B2
US 12,542,260 · App. 18/081,388 · Granted Feb 3, 2026

Surface topologies of electrostatic substrate support for particle reduction

Inventors: Arvinder Manmohan Singh Chadha (San Jose, CA); Christopher Beaudry (Santa Clara, CA)
Assignee: Applied Materials, Inc.
H01J37/32715G03F7/202H01J2237/2007H01J2237/332
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,542,260
App. No.
18/081,388
Granted
Feb 3, 2026
Kind
B2
Abstract

A substrate support for use in a processing chamber to hold a substrate thereon includes a substrate support body, and a plurality of mesas on recessed surfaces of the substrate support body, wherein heights of the plurality of mesas from the recessed surfaces vary over the substrate support body between at least two different heights.

Claims (35)

1 . A substrate support for use in a processing chamber, comprising:

a substrate support body configured to hold a substrate thereon; and

a plurality of mesas on recessed surfaces of the substrate support body, the plurality of mesas comprising ceramic material, wherein

the substrate support body comprises active materials that exhibit piezo-electricity or piezo-resistivity to change heights of the plurality of mesas from the recessed surfaces to conform to the substrate.

2 . The substrate support of claim 1 , wherein

the substrate support body comprises ceramic material selected from the group consisting of silicon carbide (SiC), aluminum oxide (Al 2 O 3 ), aluminum nitride (AlN), titanium oxide (TiO), titanium nitride (TiN), yttrium oxide (Y 2 O 3 ), and combinations thereof.

3 . The substrate support of claim 1 , wherein

the plurality of mesas comprises material having higher hardness than the substrate support body.

4 . The substrate support of claim 1 , wherein

the heights of the plurality of mesas are between 1 μm and 5 mm, and

height differences different heights of the plurality of mesas are between 1 μm and 5 mm, and

the plurality of mesas have a width of between 20 μm and 20 mm and a spacing between adjacent mesas of between 20 μm and 20 mm.

5 . The substrate support of claim 1 , wherein a contact area of the plurality of mesas with a substrate to be disposed thereon is less than 20% of a backside surface area of the substrate.

6 . The substrate support of claim 1 , wherein the plurality of mesas is formed by a laser ablation process.

7 . A substrate support for use in a processing chamber to hold a substrate thereon, comprising:

a substrate support body; and

a plurality of mesas on recessed surfaces of the substrate support body, each of the plurality of mesas having elevated elongated features with holes formed therebetween from a top surface of the elevated elongated features.

8 . The substrate support of claim 7 , wherein

the substrate support body comprise ceramic material selected from the group consisting of silicon carbide (SiC), aluminum oxide (Al 2 O 3 ), aluminum nitride (AlN), titanium oxide (TiO), titanium nitride (TiN), yttrium oxide (Y 2 O 3 ), and combinations thereof.

9 . The substrate support of claim 7 , wherein

the plurality of mesas comprises ceramic material having higher hardness than the substrate support body.

10 . The substrate support of claim 7 , wherein

the plurality of mesas has height of the plurality of mesas are between 1 μm and 5 mm, a width of between 20 μm and 20 mm and a spacing between adjacent mesas of between 20 μm and 20 mm.

11 . The substrate support of claim 10 , wherein

the holes are partial holes having a depth shorter than the height of the plurality of mesas from the recessed surfaces.

12 . The substrate support of claim 10 , wherein

the holes are through holes having a depth longer than the height of the plurality of mesas from the recessed surfaces.

13 . The substrate support of claim 12 , wherein

the holes are in fluid communication with a channel formed within the substrate support body.

14 . The substrate support of claim 7 , wherein

the mesas is a plurality of veins having a height of between 1 μm and 5 mm, and a width of between 20 μm and 5 mm.

15 . The substrate support of claim 14 , wherein

the holes are one or more grooves formed in one or more veins of the plurality of veins.

16 . The substrates support of claim 7 , wherein a contact area of the plurality of mesas with a substrate to be disposed thereon is less than 20% of a backside surface area of the substrate.

17 . The substrate support of claim 8 , wherein the plurality of mesas is formed by a laser ablation process.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 11, 2023
From: CHADHA, ARVINDER MANMOHAN SINGH; BEAUDRY, CHRISTOPHER
To: APPLIED MATERIALS, INC.
Reel/Frame 062340/0707 →
Continuity (1)
Related Publication 20240203705A1 · Jun 20, 2024
References Cited (15)
US 7672110B2 · Sun et al. · 2010 [cited by applicant]
US 10020218B2 · Boyd, Jr. et al. · 2018 [cited by applicant]
US 10654147B2 · Boyd, Jr. et al. · 2020 [cited by applicant]
US 20050287445A1 · Liu · 2005 [cited by applicant]
US 20160036355A1 · Moriya · 2016 [cited by examiner]
US 20170162552A1 · Thompson · 2017 [cited by examiner]
US 20180148835A1 · Erickson et al. · 2018 [cited by applicant]
US 20190067899A1 · Tsuji · 2019 [cited by examiner]
US 20200135530A1 · Shah et al. · 2020 [cited by applicant]
US 20210036187A1 · Lee · 2021 [cited by examiner]
US 20240203705A1 · Chadha · 2024 [cited by examiner]
US 20250101580A1 · Hong · 2025 [cited by examiner]
JP 2012009720A · 2012 [cited by applicant]
KR 20200045608A · 2020 [cited by applicant]
International Search Report and Written Opinion dated Jan. 26, 2024 for Application No. PCT/US2023/035024. [cited by applicant]