IP Library Granted Patent US 12,546,706
Granted Patent B2
US 12,546,706 · App. 17/709,681 · Granted Feb 10, 2026

Optical referencing from optical references with variable perturbative drift rates

Inventors: Antoine Bois (Québec, CA); Claude Gamache (Gatineau, CA); Francois Pelletier (Québec, CA)
Assignee: Ciena Corporation
G01N21/274H01S5/0687H01S5/142H04B10/572
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Quick Facts
Patent No.
US 12,546,706
App. No.
17/709,681
Granted
Feb 10, 2026
Kind
B2
Abstract

Systems and methods provide optical referencing in an optical system including a plurality of optical devices with variable perturbative drift rates. A method includes, subsequent to determining a tuning rate of one or more interrogator devices, which are tunable, and subsequent to locking the plurality of optical devices including the one or more interrogator devices, detecting a drift in spectrum of the optical system based on a perturbation; and tracking the drift based on variable perturbative drift rates of each of the plurality of optical devices which are each exposed to the perturbation.

Claims (36)

1 . A method of optical referencing in an optical system including a plurality of optical devices with variable perturbative drift rates, the method comprising the steps of:

subsequent to determining a tuning rate of one or more tunable optical devices of the plurality of optical devices, and subsequent to locking the plurality of optical devices including the one or more tunable optical devices, detecting a drift in spectrum of the optical system based on a perturbation; and

tracking the drift based on variable perturbative drift rates of each of the plurality of optical devices which are each exposed to the perturbation, wherein tracking comprises adjusting the one or more tunable optical devices to maintain optical alignment.

2 . The method of claim 1 , wherein the tracking includes mapping the drift to an absolute frequency scale based on an initial state based on an initial stored operating point obtained from a beginning-of-life (BOL) alignment and predetermined relative drift rates between the plurality of optical device.

3 . The method of claim 1 , wherein the steps further include

for calibration, aligning the one or more tunable optical devices by maximizing optical power at an output of the optical system; and

storing an obtained operating point on the one or more lunable optical devices after the aligning.

4 . The method of claim 1 , wherein the variable perturbative drift rates are predetermined based on material properties of the plurality of optical devices, at least two devices having different materials.

5 . The method of claim 1 , wherein the plurality of optical devices includes any of ring or disk resonators, Mach-Zehnder or Michelson interferometers, Fabry-Perot etalons, Bragg gratings or thin-film filters.

6 . The method of claim 1 , wherein the steps further include

determining a wavelength shift of a source utilizing the tracking based on a known initial wavelength of the source.

7 . The method of claim 1 , wherein the steps further include

performing a measurement based on the tracking.

8 . The method of claim 1 , wherein the plurality of optical devices includes at least three optical devices, and wherein the steps further include

performing the tracking based on gradients of the variable perturbative drift rates between the at least three optical devices.

9 . The method of claim 1 , wherein the optical system excludes a temperature sensor.

10 . The method of claim 1 , wherein the optical system is one of a tunable laser and an optical channel monitor (OCM).

11 . An optical system configured to provide optical referencing, the optical system comprising:

a source;

a plurality of optical devices including one or more tunable optical devices, connected to the source;

a photodetector connected to the plurality of optical devices; and

circuitry configured to

subsequent to a determination of a tuning rate of the one or more tunable optical devices, and subsequent to locking the plurality of optical devices, detect a drift in spectrum of the optical system based on a perturbation, and

track the drift based on variable perturbative drift rates of each of the plurality of optical devices which are each exposed to the perturbation.

12 . The optical system of claim 11 , wherein the circuitry is configured to track the drift by mapping the drift to an absolute frequency scale based on an initial state based on an initial stored operating point obtained from a beginning-of-life (BOL) alignment and predetermined relative drift rates between the plurality of optical device.

13 . The optical system of claim 11 , wherein the circuitry includes

a stored value for the tuning rate of one or more tunable optical devices, and

obtained operating points on the one or more tunable optical devices after the locking.

14 . The optical system of claim 11 , wherein the variable perturbative drift rates are predetermined based on material properties of the plurality of optical devices, at least two devices having different materials.

15 . The optical system of claim 11 , wherein the plurality of optical devices includes any of ring or disk resonators, Mach-Zehnder or Michelson interferometers, Fabry-Perot etalons, Bragg gratings or thin-film filters.

16 . The optical system of claim 11 , wherein the circuitry is configured to determine a wavelength shift of the source based on a known initial wavelength of the source.

17 . The optical system of claim 11 , wherein the circuitry is configured to perform a measurement based on the drift.

18 . The optical system of claim 11 , wherein the plurality of optical devices includes at least three optical devices, and wherein the circuitry is configured to

track the drift based on gradients of the variable perturbative drift rates between the at least three optical devices.

19 . The optical system of claim 11 , wherein the optical system is one of a tunable laser and an optical channel monitor (OCM).

20 . The optical system of claim 11 , wherein the optical system includes a series of cascaded integrated resonators each with a through port and a drop port, and wherein the circuitry is further configured to align a first integrated resonator utilizing its through port by maximizing optical power at a wavelength and subsequently align remaining integrated resonators by maximizing the optical power at the wavelength.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 31, 2022
From: BOIS, ANTOINE; GAMACHE, CLAUDE; PELLETIER, FRANCOIS
To: CIENA CORPORATION
Reel/Frame 059456/0725 →
Continuity (1)
Related Publication 20230314310A1 · Oct 5, 2023
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