Multi-axis test equipment
Embodiments herein relate to a testing apparatus for coupling with a device-under-test (DUT). The apparatus may include a base portion configured to couple to a testing platform, wherein the base portion is configured to rotate the DUT around a first axis. The apparatus may further include an arm portion configured to rotate the DUT around a second axis perpendicular to the first axis. The apparatus may further include a platform portion configured to couple to the DUT. Other embodiments may be described and claimed.
1 . A testing apparatus for coupling with a device-under-test (DUT), wherein the apparatus comprises:
a base portion configured to couple to a surface, wherein the base portion is configured to rotate the DUT around a first axis;
an arm portion coupled to the base portion, the arm portion configured to rotate the DUT around a second axis perpendicular to the first axis; and
a frequency extender portion coupled to the arm portion, wherein a width of the frequency extender portion is selectively adjustable based on insertion or removal of a spacer, and the frequency extender portion includes a frequency extender.
2 . The testing apparatus of claim 1 , wherein the frequency extender includes a platform configured to couple with the DUT.
3 . The testing apparatus of claim 1 , wherein the frequency extender includes a metallic waveguide configured to communicate with the DUT.
4 . The testing apparatus of claim 3 , wherein the waveguide is a rigid metallic structure.
5 . The testing apparatus of claim 1 , wherein the frequency extender is configured to:
receive, from the DUT, a first radio frequency (RF) signal with a frequency between 50 gigahertz (GHz) and 500 GHZ;
convert the first RF signal to a second RF signal with a frequency below 110 GHz; and
output the second RF signal from the frequency extender.
6 . The testing apparatus of claim 5 , wherein the frequency extender includes a platform configured to couple with the DUT.
7 . The testing apparatus of claim 5 , wherein the frequency extender includes a metallic waveguide configured to communicate with the DUT.
8 . The testing apparatus of claim 7 , wherein the waveguide is a rigid metallic structure.
9 . The testing apparatus of claim 5 , wherein the frequency extender is configured to provide the second RF signal to a flexible cable that is coupled with the frequency extender.
10 . The testing apparatus of claim 5 , wherein the frequency extender is configured to convert the first RF signal to the second RF signal based on a local oscillator signal that is input to the frequency extender.
11 . The testing apparatus of claim 1 , wherein the frequency extender is configured to:
receive a first radio frequency (RF) signal with a first frequency from the DUT or an input port of the frequency extender;
convert the first RF signal to a second RF signal with a second frequency that is different than the first frequency; and
provide the second RF signal to the DUT or an output port of the frequency extender.
12 . The testing apparatus of claim 11 , wherein the first frequency is less than or equal to 110 gigahertz (GHZ) and the second frequency is greater than or equal to 50 GHz.
13 . The testing apparatus of claim 12 , wherein the first frequency is less than or equal to 70 GHz.
14 . The testing apparatus of claim 12 , wherein the second frequency is greater than or equal to 70 GHz.
15 . The testing apparatus of claim 11 , wherein the second frequency is less than or equal to 110 gigahertz (GHZ) and the first frequency is greater than or equal to 50 GHz.
16 . The testing apparatus of claim 15 , wherein the first frequency is greater than or equal to 70 GHz and the second frequency is less than or equal to 70 GHz.
17 . The testing apparatus of claim 1 , wherein the frequency extender is configured to:
receive a first radio frequency (RF) signal with a frequency below 70 gigahertz (GHz);
convert the first RF signal to a second RF signal with a frequency between 70 and 500 GHz; and
provide the second RF signal to the DUT.
18 . The testing apparatus of claim 17 , wherein the frequency extender is configured to receive the first RF signal from a flexible cable that is coupled with the frequency extender.
19 . The testing apparatus of claim 17 , wherein the frequency extender is configured to convert the first RF signal to the second RF signal based on a frequency multiplier configured to increase the frequency of the first RF signal.
20 . The testing apparatus of claim 1 , wherein the width of the arm portion is adjustable based on the insertion or removal of the spacer between elements of the arm portion.