IP Library Granted Patent US 12,554,193
Granted Patent B2
US 12,554,193 · App. 18/071,296 · Granted Feb 17, 2026

Pellicle comprising silicon carbide nanostructure and related devices and methods

Inventors: Amelia Heather-Sarah Church Hart (Fort Worth, TX); James O'Neill (Winchester, MA)
Assignee: ENTEGRIS, INC.
G03F1/64C01B32/956G03F1/22G03F7/70033G03F7/70983B82Y30/00B82Y40/00C01P2004/13
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Quick Facts
Patent No.
US 12,554,193
App. No.
18/071,296
Granted
Feb 17, 2026
Kind
B2
Abstract

Disclosed are pellicles for use in extreme ultraviolet (EUV) lithography, the pellicles comprising silicon carbide nanostructures, and exhibiting high transmittance of EUV exposure light and high mechanical strength, as well as methods of using these pellicles.

Claims (17)

1 . A pellicle useful in an extreme ultraviolet lithography process, the pellicle comprising a membrane that includes silicon carbide nanostructures, wherein the membrane is capable of being self-supporting such that it supports its own weight when being held and suspended by a pellicle frame, and wherein the silicon carbide nanostructures are silicon carbide nanotubes having a core/shell structure comprising silicon carbide outer walls and graphene inner walls resulting from the chemical conversion of carbon nanotubes.

2 . The pellicle of claim 1 , the silicon carbide nanostructures comprising silicon carbide nanotubes.

3 . The pellicle of claim 1 , having a transmittance of at least 80 percent of light having a wavelength of 13.5 nanometer.

4 . The pellicle of claim 1 , the membrane having a thickness that is less than 200 nanometers.

5 . The pellicle of claim 1 , the membrane having a thickness in a range from 50 to 150 nanometers.

6 . The pellicle of claim 1 supported in a planar configuration by a frame at a perimeter of the pellicle.

7 . The pellicle of claim 1 , consisting of the membrane.

8 . The pellicle of claim 1 , that does not include a metal coating.

9 . A lithography mask assembly useful in an extreme ultraviolet lithography process, the mask assembly comprising:

a frame having a perimeter, a first face, a second face, and a thickness between the first face and the second face;

a pellicle disposed at the first face, the pellicle comprising a membrane that includes silicon carbide nanostructures, wherein the membrane is capable of being self-supporting such that it supports its own weight when being held and suspended by a pellicle frame, and wherein the silicon carbide nanostructures are silicon carbide nanotubes having a core/shell structure comprising silicon carbide outer walls and graphene inner walls resulting from the chemical conversion of carbon nanotubes; and

a reflective lithography mask disposed on the second face and having a patterned reflective surface facing the pellicle.

10 . The mask assembly of claim 9 , the silicon carbide nanostructures comprising silicon carbide nanotubes.

11 . The mask assembly of claim 9 , having a transmittance of at least 80 percent of 13.5 nanometer light.

12 . The mask assembly of claim 9 , the membrane having a thickness in a range from 50 to 150 nanometers.

13 . The mask assembly of claim 9 , wherein the pellicle consists of the membrane.

14 . The mask assembly of claim 9 , wherein the pellicle does not include a metal coating.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 29, 2022
From: HART, AMELIA HEATHER-SARAH CHURCH; O'NEILL, JAMES
To: ENTEGRIS, INC.
Reel/Frame 061911/0765 →
Continuity (2)
Provisional Application 63285343 · Dec 2, 2021
Related Publication 20230176471A1 · Jun 8, 2023
References Cited (11)
US 9588416B2 · Englund et al. · 2017 [cited by applicant]
US 20170038676A1 · Jung et al. · 2017 [cited by applicant]
US 20180149966A1 · Shin et al. · 2018 [cited by applicant]
US 20180329289A1 · Gallagher et al. · 2018 [cited by applicant]
US 20190390090A1 · Kim et al. · 2019 [cited by applicant]
US 20210132490A1 · Lin · 2021 [cited by applicant]
US 20210191255A1 · Timmermans et al. · 2021 [cited by applicant]
US 20220244634A1 · Hsu · 2022 [cited by examiner]
TW 201918372A · 2019 [cited by applicant]
WO 2005085130A2 · 2005 [cited by applicant]
WO 2021172104A1 · 2021 [cited by applicant]