Semiconductor package
A semiconductor package includes: a first semiconductor chip on a first package substrate; a second semiconductor chip on a second package substrate; an interposer between the first semiconductor chip and the second package substrate; and a heat dissipation layer on the interposer, wherein the first and second semiconductor chips are spaced apart from each other horizontally and do not overlap in a vertical direction, and wherein a first portion of the heat dissipation layer at least partially overlapping the first semiconductor chip in the vertical direction and a second portion of the heat dissipation layer at least partially overlapping the second semiconductor chip in the vertical direction are spaced apart from each other, and the first portion is positioned around an outer boundary of the second portion.
1 . A semiconductor package comprising:
a first semiconductor chip on a first package substrate;
a second semiconductor chip on a second package substrate;
an interposer between the first semiconductor chip and the second package substrate; and
a heat dissipation layer on the interposer,
wherein the first and second semiconductor chips are spaced apart from each other horizontally and do not overlap in a vertical direction, and
wherein a first portion of the heat dissipation layer at least partially overlapping the first semiconductor chip in the vertical direction and a second portion of the heat dissipation layer at least partially overlapping the second semiconductor chip in the vertical direction are spaced apart from each other, and
the first portion is positioned around an outer boundary of the second portion.
2 . The semiconductor package of claim 1 , wherein the first portion comprises an inner boundary defining an interior region, and the second portion is in the interior region of the first portion.
3 . The semiconductor package of claim 1 , wherein the heat dissipation layer further comprises a heat insulating pattern between a first projection comprising a projection of the first semiconductor chip on a plane comprising the heat dissipation layer and a second projection comprising a projection of the second semiconductor chip on a plane comprising the heat dissipation layer.
4 . The semiconductor package of claim 3 , wherein the heat insulating pattern is around an outer boundary of the second portion at an inner boundary of the first portion.
5 . The semiconductor package of claim 3 , wherein, when the second package substrate is projected on a plane comprising the heat dissipation layer, a third projection of the second package substrate the plane comprising the heat dissipation layer at least partially overlaps the first portion, and
the heat insulating pattern is around an outer boundary of the third projection in the first portion.
6 . The semiconductor package of claim 3 , wherein thermal conductivity of the heat insulating pattern is less than that of the heat dissipation layer.
7 . The semiconductor package of claim 1 , wherein a conductive connector is between the first portion and the second portion on the interposer.
8 . The semiconductor package of claim 1 , a first projection comprises a projection of the first semiconductor chip on a plane comprising the heat dissipation layer and a second projection comprises a projection of the second semiconductor chip on a plane comprising the heat dissipation layer,
wherein the second portion comprises:
a center portion in the second projection;
an edge portion spaced apart from the center portion in an outer direction and around an outer boundary of the center portion; and
a connection line connecting the center portion to the edge portion,
wherein a plurality of conductive connectors is in an area between the center portion and the edge portion.
9 . The semiconductor package of claim 8 , wherein, when the second package substrate is projected on a plane comprising the heat dissipation layer to form a third projection, an outer boundary of the third projection is in the edge portion.
10 . The semiconductor package of claim 1 , further comprising an adhesive layer between the interposer and the heat dissipation layer.
11 . A semiconductor package comprising:
a first semiconductor chip on a first package substrate;
a second semiconductor chip on a second package substrate;
an interposer between the first semiconductor chip and the second package substrate; and
a heat dissipation layer arranged on the interposer,
wherein, when the first semiconductor chip and the second semiconductor chip are projected on a plane comprising the heat dissipation layer, a first projection, which is a projection of the first semiconductor chip in a first region of the plane comprising the heat dissipation layer, and a second projection, which is a projection of the second semiconductor chip in a second region of the plane comprising the heat dissipation layer, do not overlap each other, and
wherein a first portion of the heat dissipation layer at least partially overlapping the first projection and a second portion of the heat dissipation layer at least partially overlapping the second projection are at least partially spaced apart from each other, and
wherein the first portion is positioned around an outer boundary of the second portion, and
connected to the second portion via a bridge portion of the heat dissipation layer.
12 . The semiconductor package of claim 11 , wherein the heat dissipation layer further comprises a heat insulating pattern between the first projection and the second projection.
13 . The semiconductor package of claim 12 , wherein the heat insulating pattern extends along an inner boundary of the first portion.
14 . The semiconductor package of claim 11 , wherein a plurality of conductive connectors is arranged between the first portion and the second portion on the interposer.
15 . The semiconductor package of claim 11 , wherein an upper surface of the heat dissipation layer is at a vertically lower level than a lower surface of the second package substrate.
16 . A semiconductor package comprising:
a first semiconductor chip on a first package substrate;
a second semiconductor chip on a second package substrate;
an interposer between the first semiconductor chip and the second package substrate;
a heat dissipation layer and a conductive connector on the interposer; and
an adhesive layer between the interposer and the heat dissipation layer,
wherein, when the first semiconductor chip and the second semiconductor chip are projected on a plane comprising the heat dissipation layer, a first projection, which is a projection of the first semiconductor chip in a first region of the plane comprising the heat dissipation layer, and a second projection, which is a projection of the second semiconductor chip in a second region of the plane comprising the heat dissipation layer, do not overlap each other, and
wherein a first portion of the heat dissipation layer at least partially overlapping the first projection and a second portion of the heat dissipation layer at least partially overlapping the second projection are spaced apart from each other, and
wherein the first portion is positioned around an outer boundary of the second portion,
the first portion comprises an inner boundary defining an interior region, and the second portion is in the interior region of the first portion, and
the conductive connector is between the first portion and the second portion.
17 . The semiconductor package of claim 16 , wherein the heat dissipation layer further comprises a heat insulating pattern extending along an inner boundary of the first portion, and the heat insulating pattern is around an outer portion of the second portion between the first projection and the second projection.
18 . The semiconductor package of claim 16 , wherein ones of a plurality of first semiconductor chips are sequentially stacked in a vertical direction on the first package substrate, and
the first projection is a projection of a semiconductor chip most adjacent to the interposer of the plurality of first semiconductor chips.
19 . The semiconductor package of claim 16 , wherein a plurality of second semiconductor chips are arranged in a horizontal direction on the second package substrate, and
the second projection is a set of projections of the plurality of second semiconductor chips.
20 . The semiconductor package of claim 19 , wherein the second portion comprises a plurality of heat dissipation pads at least partially overlapping the projections of the plurality of second semiconductor chips,
each of the plurality of heat dissipation pads are positioned to be spaced apart from each other, and
the conductive connector is arranged between the plurality of heat dissipation pads.