Multilayer structure
A multilayer structure of the present invention is a multilayer structure including a base substrate and a semiconductor film that is made of α-Ga 2 O 3 or an α-Ga 2 O 3 -based solid solution and has a corundum crystal structure, the semiconductor film being disposed on the base substrate. The semiconductor film has an average film thickness of greater than or equal to 10 μm. The semiconductor film is convexly or concavely warped. An amount of warpage of the semiconductor film is 20 μm or greater and 64 μm or less.
1 . A multilayer structure comprising:
a base substrate; and
a semiconductor film made of α-Ga 2 O 3 or an α-Ga 2 O 3 -based solid solution and having a corundum crystal structure, the semiconductor film being disposed on the base substrate, wherein
the semiconductor film has an average film thickness of greater than or equal to 10 μm,
the semiconductor film is convexly or concavely warped, and
an amount of warpage of the semiconductor film is 20 μm or greater and 64 μm or less.
2 . The multilayer structure according to claim 1 , wherein the amount of warpage of the semiconductor film is defined by an amount α of warpage and by an amount β of warpage, in an instance in which, in a plan-view illustration of the semiconductor film as viewed in plan, a straight line X and a straight line Y are defined as two straight lines passing a point G and being orthogonal to each other, the point G being a center of gravity in the plan-view illustration; a point A and a point B are defined as two points each positioned on the straight line X and 20 mm away from the point G, and a point C and a point D are defined as two points each positioned on the straight line Y and 20 mm away from the point G; a point P is defined as a point from which a distance to a line segment AB is a maximum, among points on a curved line AB, which is a curved line extending on a surface of the semiconductor film from the point A to the point B, and a point R is defined as a point from which a distance to a line segment CD is a maximum, among points on a curved line CD, which is a curved line extending on the surface of the semiconductor film from the point C to the point D; and the amount α of warpage is defined as the distance from the point P to the line segment AB, and the amount β of warpage is defined as the distance from the point R to the line segment CD.
3 . The multilayer structure according to claim 2 , wherein in an instance in which a point O is defined as a point positioned on the surface of the semiconductor film and corresponding to the point G, a length of a line segment PO is less than or equal to 10 mm, and a length of a line segment RO is less than or equal to 10 mm.
4 . The multilayer structure according to claim 2 , wherein a value of the smaller of the amount α of warpage and the amount β of warpage is 50% or greater and 100% or less of a value of the larger of the amount α of warpage and the amount β of warpage.
5 . The multilayer structure according to claim 1 , wherein the amount of warpage of the semiconductor film is 30 μm or greater and 64 μm or less.