IP Library › Granted Patent US 12,592,359
Granted Patent B2
US 12,592,359 · App. 18/478,826 · Granted Mar 31, 2026

Apparatus, system and method for energy spread ion beam

Inventors: Paul J. Murphy (Reading, MA); Frank Sinclair (Hartland, ME); Jun Lu (Beverly, MA); Daniel Tieger (Manchester, MA); Anthony Renau (West Newbury, MA)
Assignee: Applied Materials, Inc.
H01J37/3171C23C14/48H01J37/05H01J37/08H01J37/3007H01J37/304H01J37/32082H01J2237/24585H01L21/265
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Quick Facts
Patent No.
US 12,592,359
App. No.
18/478,826
Granted
Mar 31, 2026
Kind
B2
Abstract

An ion implanter may include an ion source, arranged to generate a continuous ion beam, a DC acceleration system, to accelerate the continuous ion beam, as well as an AC linear accelerator to receive the continuous ion beam and to output a bunched ion beam. The ion implanter may also include an energy spreading electrode assembly, to receive the bunched ion beam and to apply an RF voltage between a plurality of electrodes of the energy spreading electrode assembly, along a local direction of propagation of the bunched ion beam.

Claims (12)

1 . An ion implanter, comprising:

an ion source arranged to generate an ion beam;

a scanner disposed downstream of the ion source in a direction of travel of the ion beam; and

an energy spreading electrode assembly disposed downstream of the scanner, to receive the ion beam and to apply a time varying voltage bias signal between a plurality of electrodes of the energy spreading electrode assembly to generate an energy spread of the ion beam.

2 . The ion implanter of claim 1 , wherein the energy spread is dependent on the time varying voltage bias signal.

3 . The ion implanter of claim 1 , wherein the energy spread provides a first implant profile in a substrate for a nominal ion energy that is broader than a second implant profile in the substrate that is generated when a monoenergetic ion beam of the same nominal energy is directed to the substrate.

4 . The ion implanter of claim 1 , where the energy spread has an energy distribution equal to 1% to 30% of an initial energy of the ion beam.

5 . The ion implanter of claim 1 , wherein the time varying voltage bias signal is an RF voltage.

6 . The ion implanter of claim 1 , wherein the time varying voltage bias signal is an AC voltage.

7 . The ion implanter of claim 1 , wherein the scanner is operative to scan the ion beam at a first frequency, and wherein the time varying voltage bias signal is applied at a second frequency, at least ten times greater than the first frequency.

8 . The ion implanter of claim 7 , wherein the ion beam is elongated along a lateral direction, perpendicular to a local direction of propagation of the ion beam, wherein the energy spreading electrode assembly is arranged to apply a uniform energy spread to the ion beam across a width of the ion beam along the lateral direction.

9 . The ion implanter of claim 1 , further comprising a linear accelerator, disposed between the ion source and the energy spreading electrode assembly, and arranged to increase an energy of the ion beam.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 10, 2023
From: MURPHY, PAUL J.; SINCLAIR, FRANK; LU, JUN; TIEGER, DANIEL; RENAU, ANTHONY
To: APPLIED MATERIALS, INC.
Reel/Frame 065167/0093 →
Continuity (3)
Continuation PCTUS2022015959 · Feb 10, 2022
Continuation 17221033 · Apr 2, 2021
Related Publication 20240029997A1 · Jan 25, 2024
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