IP Library Granted Patent US 12,609,328
Granted Patent B2
US 12,609,328 · App. 17/950,611 · Granted Apr 21, 2026

Interconnector for solid-oxide electrochemical cell stack and solid-oxide electrochemical cell stack

Inventors: Shohei Kobayashi (Kawasaki, JP); Tsuneji Kameda (Ota, JP); Masahiro Asayama (Yokohama, JP); Masato Yoshino (Yokohama, JP); Norikazu Osada (Ota, JP); Riko Inuzuka (Kawasaki, JP)
Assignee: TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATION
H01M8/0245H01M8/021H01M8/0228H01M8/0232H01M8/12H01M2008/1293
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Quick Facts
Patent No.
US 12,609,328
App. No.
17/950,611
Granted
Apr 21, 2026
Kind
B2
Abstract

An interconnector for a solid-oxide electrochemical cell stack of the embodiment includes: a metal base containing an iron-based alloy containing chromium; and a protective film provided on a surface of the metal base. The protective film includes a protective film body containing at least one selected from a spinel oxide and a perovskite oxide, and dispersed phases scattered in the protective film body and containing an oxide of at least one element selected from the group consisting of rare earth elements and zirconium.

Claims (30)

1 . An interconnector for a solid-oxide electrochemical cell stack, comprising:

a metal base including an iron-based alloy containing chromium; and

a protective film provided on a surface of the metal base, wherein

the protective film includes a protective film body containing at least one selected from the group consisting of a spinel oxide and a perovskite oxide, and dispersed phases scattered in the protective film body and containing yttrium oxide, wherein

the protective film body contains at least one metallic element selected from the group consisting of Co, Ni, Mn, Cu, Fe, Cr, Zn, Al, Ti, La, and Sr, and

the protective film contains 8 mass % or more and 16 mass % or less of the yttrium oxide in terms of yttrium.

2 . The interconnector according to claim 1 , wherein

the protective film has a film thickness of 100 μm or less.

3 . The interconnector according to claim 1 , wherein

a porosity in the protective film is 6% or less.

4 . The interconnector according to claim 1 , wherein

the protective film body contains Co and at least one metallic element selected from the group consisting of Ni, Mn, Cu, Fe, Cr, Zn, Al, and Ti.

5 . The interconnector according to claim 1 , wherein

the protective film body contains at least one selected from the spinel oxide containing Co and the perovskite oxide containing Co and at least one selected from the group consisting of La and Sr.

6 . A solid-oxide electrochemical cell stack, comprising:

a first electrochemical cell including a first electrode in contact with an atmosphere containing a substance having hydrogen atoms, a second electrode in contact with an atmosphere containing oxygen, and a solid-oxide electrolyte layer interposed between the first electrode and the second electrode;

a second electrochemical cell including a first electrode in contact with an atmosphere containing a substance having hydrogen atoms, a second electrode in contact with an atmosphere containing oxygen, and a solid-oxide electrolyte layer interposed between the first electrode and the second electrode; and

an interconnector disposed between the first electrode of the first electrochemical cell and the second electrode of the second electrochemical cell to be electrically connected with the first electrode and the second electrode, wherein

the interconnector comprises a metal base containing an iron-based alloy containing chromium and a protective film provided on a surface of the metal base, and

the protective film includes a protective film body containing at least one selected from the group consisting of a spinel oxide and a perovskite oxide, and dispersed phases scattered in the protective film body and containing yttrium oxide, wherein

the protective film body contains at least one metallic element selected from the group consisting of Co, Ni, Mn, Cu, Fe, Cr, Zn, Al, Ti, La, and Sr, and

the protective film contains 8 mass % or more and 16 mass % or less of the yttrium oxide in terms of yttrium.

7 . The electrochemical cell stack according to claim 6 , wherein

the protective film has a film thickness of 100 μm or less.

8 . The electrochemical cell stack according to claim 6 , wherein

a porosity in the protective film is 6% or less.

9 . The electrochemical cell stack according to claim 6 , wherein

the protective film body contains Co and at least one metallic element selected from the group consisting of Ni, Mn, Cu, Fe, Cr, Zn, Al, and Ti.

10 . The electrochemical cell stack according to claim 6 , wherein

the protective film body contains at least one selected from the spinel oxide containing Co and the perovskite oxide containing Co and at least one selected from the group consisting of La and Sr.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 10, 2022
From: KOBAYASHI, SHOHEI; KAMEDA, TSUNEJI; ASAYAMA, MASAHIRO; YOSHINO, MASATO; OSADA, NORIKAZU; INUZUKA, RIKO
To: TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATION
Reel/Frame 061729/0178 →
Priority Claims (2)
JP 2021-169833 · Oct 15, 2021 · national
JP 2022-140458 · Sep 5, 2022 · national
Continuity (1)
Related Publication 20230120134A1 · Apr 20, 2023
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