IP Library › Granted Patent US 12,622,184
Granted Patent B2
US 12,622,184 · App. 18/219,717 · Granted May 5, 2026

Resistive switching device and fabrication method thereof

Inventors: Wen-Jen Wang (Tainan City, TW); Yu-Huan Yeh (Hsinchu City, TW); Chuan-Fu Wang (Miaoli County, TW)
Assignee: UNITED MICROELECTRONICS CORP.
H10N70/8418H10B63/00H10N70/011H10N70/24H10N70/8265H10N70/8833
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Quick Facts
Patent No.
US 12,622,184
App. No.
18/219,717
Granted
May 5, 2026
Kind
B2
Abstract

A resistive switching device includes a substrate; a first dielectric layer on the substrate; a conductive via in the first dielectric layer; a bottom electrode on the conductive via and the first dielectric layer, a resistive switching layer on the bottom electrode; and a cone-shaped top electrode on the resistive switching layer. The cone-shaped top electrode can produce increased and concentrated electric field during operation, which facilitates the filament forming process.

Claims (36)

1 . A resistive switching device, comprising:

a substrate;

a first dielectric layer on the substrate;

a conductive via in the first dielectric layer;

a bottom electrode on the conductive via and the first dielectric layer;

a resistive switching layer on the bottom electrode; and

a cone-shaped top electrode on the resistive switching layer and comprising a tip, wherein a bottom width of the cone-shaped top electrode is wider than a width of the tip.

2 . The resistive switching device according to claim 1 , wherein the conductive via comprises tungsten.

3 . The resistive switching device according to claim 1 , further comprising a spacer layer covering the cone-shaped top electrode, wherein the pointed tip of the cone-shaped top electrode protrudes from an upper surface of the spacer layer.

4 . The resistive switching device according to claim 3 , wherein the spacer layer further covers a sidewall of the resistive switching layer and a top surface of the first dielectric layer.

5 . The resistive switching device according to claim 3 further comprising:

a second dielectric layer on the spacer layer; and

a contact penetrating through the second dielectric layer and the spacer layer and being electrically connected with the cone-shaped top electrode.

6 . The resistive switching device according to claim 1 , wherein the bottom electrode comprises TaN and the cone-shaped top electrode comprises TiN.

7 . The resistive switching device according to claim 1 , wherein the bottom electrode comprises a recessed sidewall.

8 . The resistive switching device according to claim 7 , wherein the spacer layer covering the recessed sidewall of the bottom electrode.

9 . The resistive switching device according to claim 1 , wherein a bottom width of the resistive switching layer connecting to the bottom electrode is greater than a bottom width of the bottom electrode away from the resistive switching layer.

10 . The resistive switching device according to claim 1 , wherein a width of the resistive switching layer is greater than a bottom width of the cone-shaped top electrode.

11 . A method for forming a resistive switching device, comprising:

providing a substrate;

forming a first dielectric layer on the substrate;

forming a conductive via in the first dielectric layer;

forming a bottom electrode on the conductive via and the first dielectric layer;

forming a resistive switching layer on the bottom electrode; and

forming a cone-shaped top electrode on the resistive switching layer, wherein the cone-shaped top electrode comprises a tip, and wherein a bottom width of the cone-shaped top electrode is wider than a width of the tip.

12 . The method according to claim 11 , wherein the conductive via comprises tungsten.

13 . The method according to claim 11 , further comprising a spacer layer covering the cone-shaped top electrode, wherein the pointed tip of the cone-shaped top electrode protrudes from an upper surface of the spacer layer.

14 . The method according to claim 13 , wherein the spacer layer further covers a sidewall of the resistive switching layer and a top surface of the first dielectric layer.

15 . The method according to claim 13 further comprising:

forming a second dielectric layer on the spacer layer; and

forming a contact penetrating through the second dielectric layer and the spacer layer and being electrically connected with the cone-shaped top electrode.

16 . The method according to claim 11 , wherein the bottom electrode comprises TaN and the cone-shaped top electrode comprises TiN.

17 . The method according to claim 11 , wherein the bottom electrode comprises a recessed sidewall.

18 . The method according to claim 17 , wherein the spacer layer covering the recessed sidewall of the bottom electrode.

19 . The method according to claim 11 , wherein a bottom width of the resistive switching layer connecting to the bottom electrode is greater than a bottom width of the bottom electrode away from the resistive switching layer.

20 . The method according to claim 11 , wherein a width of the resistive switching layer is greater than a bottom width of the cone-shaped top electrode.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 10, 2023
From: WANG, WEN-JEN; YEH, YU-HUAN; WANG, CHUAN-FU
To: UNITED MICROELECTRONICS CORP.
Reel/Frame 064193/0716 →
Priority Claims (1)
TW 112120825 · Jun 5, 2023 · national
Continuity (1)
Related Publication 20240407274A1 · Dec 5, 2024
References Cited (4)
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US 11502254B2 · Strutt · 2022 [cited by examiner]
US 20220069207A1 · McCrate · 2022 [cited by examiner]
US 20250194442A1 · Sung · 2025 [cited by examiner]