Semiconductor device and manufacturing method of semiconductor device
A semiconductor device may include: a first gate structure; a second gate structure disposed over the first gate structure; and a channel structure including a first portion extending through the first gate structure, the first portion having a tapered cross section, a second portion having a tapered cross section, and a third portion connecting the first portion with the second portion, wherein the third portion has a vertical profile, and wherein the second portion and the third portion extends through the second gate structure.
1 . A semiconductor device comprising:
a first gate structure;
a second gate structure disposed over the first gate structure; and
a channel structure including a first portion extending through the first gate structure, the first portion having a tapered cross section, a second portion having a tapered cross section, and a third portion connecting the first portion with the second portion,
wherein the third portion has a vertical profile, and
wherein the second portion and the third portion extends through the second gate structure.
2 . The semiconductor device of claim 1 , wherein the second portion extends from a top surface of the second gate structure to the third portion which extends from an intermediate level the second gate structure to a bottom surface of the gate structure where it connects with a top surface of the first portion of the channel structure.
3 . The semiconductor device of claim 1 , wherein the first portion has a first width, the second portion has a second width, and the third portion has a third width smaller than the first width or the second width.
4 . The semiconductor device of claim 3 , wherein the third width is smaller than a width of a top surface of the first portion.
5 . The semiconductor device of claim 3 , wherein the third width is substantially the same as a width of a bottom surface of the second portion.