Device and method for providing an integrated circuit with a unique identification

1. A device usable on an integrated circuit (IC) for generating an identification (ID) identifying the IC, the device comprising:

at least three identification cells, wherein:

a first identification cell of the at least three identification cells comprises a four wire resistor;

a second identification cell of the at least three identification cells comprises thin film resistors; and

a third identification cell of the at least three identification cells comprises an inverter pair; and

a measurement circuit for measuring a parameter of each of the at least three of identification cells,

wherein the device generates or produces the ID using the measured parameters.

2. The device of claim 1 , wherein the parameter results from measuring random parametric variations of the four wire resistor, the thin film resistors, and the inverter pair in each of the first, second, and third identification cells, respectively.

3. The device of claim 1 , wherein the device is an integrated circuit identification device (ICID), the ID is a identification number, and the at least three identification cells comprises a 16×16 cell array.

4. The device of claim 1 , wherein one of:

each cell has an output that is a substantial function of random parametric variations in said IC; and

the ID is substantially a function of random parametric variations in the at least three identification cells.

5. The device of claim 1 , wherein the measurement circuit monitors an output of each the at least three identification cells and generates the ID in response thereto.

6. The device of claim 1 , wherein the ID is stored as an ID record on the IC.

7. The device of claim 1 , wherein the four wire resistor comprises two wires receiving a drive current and two wires for measuring voltage.

8. The device of claim 7 , wherein the measurement circuit measures voltage at the two wires for measuring voltage and derives a resistance.

9. The device of claim 1 , wherein the thin film resistors comprises a pair of thin film resistors.

10. The device of claim 9 , wherein the measurement circuit measures voltage and derives a resistance.

11. The device of claim 1 , wherein the thin film resistors comprises two four wire resistors.

12. The device of claim 11 , wherein each four wire resistor comprises two wires receiving a drive current and two wires for measuring voltage.

13. The device of claim 12 , wherein the measurement circuit measures voltage at the two wires for measuring voltage and derives a resistance.

14. The device of claim 1 , wherein the inverter pair has random variation.

15. The device of claim 14 , wherein each inverter pair generates an ICID bit on power up.

16. The device of claim 14 , wherein each inverter pair receives an ICID bit and generates an ICID bit on power up.

17. The device of claim 1 , wherein one of:

the at least three identification cells generates the ID on power up; and

the device generates the ID when the IC is initially powered up.

18. A device usable on an integrated circuit (IC) for generating an identification (ID) identifying the IC, the device comprising:

an identification circuit formed on the IC and having a at least three identification cells, wherein:

a first identification cell of the at least three identification cells comprises a four wire resistor;

a second identification cell of the at least three identification cells comprises thin film resistors;

a third identification cell of the at least three identification cells comprises an inverter pair; and

each of the four wire resistor, the thin film resistors, and the inverter pair have random parametric variations; and

a measurement circuit formed on the IC and being utilized to generate or produce the ID based on the random parametric variations of the four wire resistor, the thin film resistors, and the inverter pair arranged in the first identification cell, the second identification cell, and the third identification cell, respectively.

19. A method of providing an integrated circuit (IC) with an identification (ID), the method comprising:

forming a device for generating the identification on the IC,

wherein the device comprises:

an identification circuit having an array of at least three identification cells;

a first identification cell of the at least three identification cells comprises one of a four wire resistor and a pair of resistors,

a second identification cell of the at least three identification cells comprises thin film resistors, and

a third identification cell of the at least three identification cells comprises a pair of inverters; and

a measurement circuit utilized in generating or producing the ID based on random parametric variations measured in the at least three identification cells of the array.

20. The device of claim 1 , wherein:

the four wire resistor comprises two wires receiving a drive current and two wires for measuring voltage and the measurement circuit measures voltage at the two wires for measuring voltage and derives a resistance of the four wire resistor;

the thin film resistors comprise a pair of thin film resistors and the measurement circuit measures voltage and derives a resistance of the pair of thin film resistors; and

the inverter pair has random variation and the inverter pair receives an ICID bit and generates an ICID bit on power up based on the differences between the pair of inverters.

21. The device of claim 20 , wherein the derived resistance of the four wire resistor, the derived resistance of the pair of thin film resistors, and the ICID bit of the pair of inverters are representative of differences in respective values of a parameter associated with each identification cell due to at least a process induced variation caused during formation of the IC, and the device generates or produces the ID using the differences in the values of the parameter.