IP Library › Granted Patent US 8,991,681
Granted Patent B2
US 8,991,681 · App. 13/412,684 · Granted Mar 31, 2015

Die bonder and bonding method

Inventors: Hiroshi Maki (Kumagaya, JP); Masayuki Mochizuki (Kumagaya, JP); Yukio Tani (Kumagaya, JP); Takehito Mochizuki (Kumagaya, JP)
Assignee: Hitachi High-Tech Instuments Co., Ltd.
H01L24/75H01L24/00H01L21/68H01L24/10H01L21/00H01L21/02H01L21/677H01L21/64H01L21/682H01L21/67H01L24/01H01L24/02H01L21/67144
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Quick Facts
Patent No.
US 8,991,681
App. No.
13/412,684
Granted
Mar 31, 2015
Kind
B2
Abstract

A die bonder and a bonding method are disclosed which make it possible to provide high-quality products, particularly even if a die is rotated through predetermined degrees relative to an already-bonded die and then laminated. In the die bonder and bonding method in which a die is picked up from a wafer by a pick-up head which then places the die on an alignment stage, and the die is picked up from the alignment stage by a bonding head which then bond the die onto a substrate or an already-bonded die, a posture of the die is rotated through predetermined degrees on a plane parallel to a plane on which the bonding is performed, before the bonding head picks up the die from the alignment stage.

Claims (8)

1. A bonding method comprising:

a picking-up step of picking up a die from a wafer by a pick-up head and placing the die on an alignment stage by setting the die away from the pick-up head;

a bonding step of picking up the die from the alignment stage by a bonding head and bonding the die onto a substrate or an already-bonded die;

a step of judging whether the die is rotated through the predetermined degrees, before the bonding head picks up the die from the alignment stage; and

a die rotating step of rotating horizontally a posture of the die, which is picked up by the pick-up head, through predetermined degrees on a plane parallel to a plane on which the bonding is performed, before the bonding head picks up the die from the alignment stage;

wherein the method includes a step of providing two alignment stages;

wherein the picking-up step of alternately performing in the two alignment stages to pick up dies from plural wafers and placing the dies on one of the two alignment stages; and

wherein the method includes a step of moving the two alignment stages in directions opposite to each other parallel to movement direction of the bonding head.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 19, 2015
From: HITACHI HIGH-TECH INSTRUMENTS CO., LTD.
To: FASFORD TECHNOLOGY CO., LTD.
Reel/Frame 035870/0158 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 17, 2012
From: MAKI, HIROSHI; MOCHIZUKI, MASAYUKI; TANI, YUKIO; MOCHIZUKI, TAKEHITO
To: HITACHI HIGH-TECH INSTRUMENTS CO., LTD.
Reel/Frame 028228/0841 →
Priority Claims (1)
JP 2011-202273 · Sep 15, 2011 · national
Continuity (1)
Related Publication 20130068823A1 · Mar 21, 2013