IP Library Granted Patent US 9,087,705
Granted Patent B2
US 9,087,705 · App. 13/910,619 · Granted Jul 21, 2015

Thin-film hybrid complementary circuits

Inventors: Tze-Chiang Chen (Yorktown Heights, NY); Bahman Hekmatshoar-Tabari (White Plains, NY); Ghavam G. Shahidi (Pound Ridge, NY); Davood Shahrjerdi (White Plains, NY)
Assignee: International Business Machines Corporation
H01L27/0623H01L29/6625H01L29/66242H01L29/66901H01L29/66916H01L29/66924H01L29/735H01L29/737H01L29/808G11C11/00H01L29/1608H01L29/20H01L29/205H01L29/22H01L29/225
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Quick Facts
Patent No.
US 9,087,705
App. No.
13/910,619
Granted
Jul 21, 2015
Kind
B2
Abstract

Complementary circuits based on junction (or heterojunction) field effect transistor devices and bipolar junction (or heterojunction) transistor devices comprised of thin crystalline semiconductor-on-insulator substrates are provided which are compatible with low-cost and/or flexible substrates. Only one substrate doping type (i.e., n-type or p-type) is required for providing the complementary circuits and thus the number of masks (typically three or four) remains the same as that required for either n-channel or p-channel devices in the TFT level.

Claims (13)

1. A semiconductor structure comprising:

a first active region comprising a first crystalline semiconductor portion of a first conductivity type located on one portion of a surface of an insulator layer, and a second active region comprising a second crystalline semiconductor portion of the first conductivity type located on another portion of the insulator layer, wherein the second active region is laterally spaced apart from the first active region;

a bipolar junction transistor located within the first active region and comprising an emitter of a second conductivity type, a base of the first conductivity type and a collector of the second conductivity type, wherein the base is located between, and laterally spaced apart from, the emitter and the collector; and

a junction field effect transistor located within the second active region and comprising a drain of the first conductivity type, a gate of the second conductivity type, and a source of the first conductivity type, wherein the gate is located between, and laterally spaced apart from, the drain and the source, and wherein the first conductivity type is opposite from the second conductivity type.

2. The semiconductor structure of claim 1 , wherein said first conductivity type is p-type and the second conductivity type is n-type.

3. The semiconductor structure of claim 1 , wherein said first conductivity type is n-type and the second conductivity type is p-type.

4. The semiconductor structure of claim 1 , wherein at least one of said bipolar junction transistor and said junction field effect transistor contains at least one heterojunction.

5. The semiconductor structure of claim 1 , wherein each of said emitter, said base, said collector, said source, said gate and said drain are comprised of at least one semiconductor material.

6. The semiconductor structure of claim 5 , wherein said at least one semiconductor material is crystalline, non-crystalline or a combination of crystalline and non-crystalline.

7. The semiconductor structure of claim 5 , wherein each of said emitter, said base, said collector, said source, said gate and said drain comprises a single-crystalline semiconductor material.

8. The semiconductor structure of claim 5 , further comprising an electrode material portion located on a topmost semiconductor material of said at least one semiconductor material.

9. The semiconductor structure of claim 5 , wherein a single electrode material portion is present on a topmost semiconductor material of said at least one semiconductor material and directly connects said collector to said drain.

10. The semiconductor structure of claim 5 , further comprising a sacrificial material portion and a passivation material portion positioned between edge portions of a bottommost semiconductor material of said at least one semiconductor material of said emitter, said base and said collector and said first crystalline semiconductor portion, and between edge portions of a bottommost semiconductor material of said at least one semiconductor material of said drain, said gate and said source and said crystalline semiconductor portion.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded May 12, 2021
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: GLOBALFOUNDRIES U.S. INC.
Reel/Frame 056987/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 20, 2020
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: GLOBALFOUNDRIES INC.
Reel/Frame 054636/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 2, 2020
From: GLOBALFOUNDRIES INC.
To: GLOBALFOUNDRIES U.S. INC.
Reel/Frame 054633/0001 →
SECURITY AGREEMENT Recorded Nov 29, 2018
From: GLOBALFOUNDRIES INC.
To: WILMINGTON TRUST, NATIONAL ASSOCIATION
Reel/Frame 049490/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 5, 2015
From: GLOBALFOUNDRIES U.S. 2 LLC; GLOBALFOUNDRIES U.S. INC.
To: GLOBALFOUNDRIES INC.
Reel/Frame 036779/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 3, 2015
From: INTERNATIONAL BUSINESS MACHINES CORPORATION
To: GLOBALFOUNDRIES U.S. 2 LLC
Reel/Frame 036550/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 5, 2013
From: CHEN, TZE-CHIANG; HEKMATSHOAR-TABARI, BAHMAN; SHAHIDI, GHAVAM G.; SHAHRJERDI, DAVOOD
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 030551/0743 →
Continuity (1)
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