IP Library Granted Patent US 9,767,921
Granted Patent B1
US 9,767,921 · App. 15/396,259 · Granted Sep 19, 2017

Timing based arbiter systems and circuits for ZQ calibration

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Quick Facts
Patent No.
US 9,767,921
App. No.
15/396,259
Granted
Sep 19, 2017
Kind
B1
Abstract

Systems and apparatuses are provided for an arbiter circuit for timing based ZQ calibration. An example system includes a resistor and a plurality of chips. Each of the plurality of chips further includes a terminal coupled to the resistor, a register storing timing information, and an arbiter circuit configured to determine whether the resistor is available based, at least in part, on the timing information stored in the register. The timing information stored in the register of each respective chip of the plurality of chips is unique to the respective chip among the plurality of chips.

Claims (43)

1. A system comprising:

a resistor; and

a plurality of chips, wherein each of the plurality of chips comprises:

a terminal coupled to the resistor;

a register storing timing information; and

an arbiter circuit configured to determine whether the resistor is available based, at least in part, on the timing information stored in the register;

wherein the timing information stored in the register of each of the plurality of chips is unique to a corresponding one of the plurality of chips.

2. The system of claim 1 , wherein each of the plurality of chips further comprises a driver circuit coupled to the terminal and the arbiter circuit is further configured to enable the driver circuit to change the potential level of the terminal before determining whether the resistor is available in each of the plurality of chips.

3. The system of claim 2 , wherein the arbiter circuit is further configured to enable the driver circuit for a duration of time that is unique to each respective chip among the plurality of chips.

4. The system of claim 2 , wherein each of the plurality of chips further comprises a calibration control circuit coupled to the driver circuit and the calibration control circuit is configured to adjust an impedance of the driver circuit after the arbiter circuit determines that the resistor is available in each of the plurality of chips.

5. The system of claim 1 , further comprising a controller configured to issue a calibration command, concurrently to each of the plurality of chips, wherein the arbiter circuit of each of the plurality of chips determines whether the resistor is available, responsive to the calibration command.

6. The system of claim 3 , wherein the availability of the resistor is determined based on the potential level of the terminal after the duration of time unique to the respective chip has elapsed.

7. The system of claim 3 , wherein the duration of time for a first chip is determined, at least in part, on the duration of time for a second chip, wherein the second chip is subservient to the first chip.

8. The system of claim 1 , wherein the register is a programmable register.

9. The system of claim 2 , wherein the arbiter circuit is configured to enable the driver circuit of a first chip to change the potential level of the terminal concurrently with at least one of a pull down or pull up calibration operation on a second chip of the plurality of chips.

10. The system of claim 2 , wherein the driver circuit is a pull down circuit.

11. An apparatus comprising:

a resistor coupled between a supply voltage and a terminal; and

a chip comprising:

an arbiter circuit coupled to the resistor via the terminal; and

a register, in communication with the arbiter circuit, configured to store timing information;

wherein the arbiter circuit is configured to:

receive a calibration command;

determine, in response to the calibration command, whether the resistor is available based on a voltage at the terminal;

drive, via a driver circuit and in response to determining that the resistor is available, the voltage at the terminal in one of a pull down or pull up direction, for a duration of time based on the timing information stored in the register; and

determine, after the duration of time has elapsed, whether the resistor is available.

12. The apparatus of claim 11 , wherein the arbiter circuit is further configured to:

transmit, to a calibration circuit, an enable signal for a calibration operation, in response to determining that the resistor is available after the duration of time has elapsed.

13. The apparatus of claim 12 , wherein the arbiter circuit is further configured to:

drive, via the driver circuit, the voltage at the terminal concurrently with a calibration operation on a second chip of the multi-chip package.

14. The apparatus of claim 11 , wherein the timing information stored in the register is unique to the chip among the multi-chip package.

15. The apparatus of claim 11 , wherein the arbiter circuit is further configured to drive the voltage at the terminal in the at least one of the pull up or pull down direction in response to determining that the resistor is available after the duration of time has elapsed.

16. The apparatus of claim 11 , wherein the duration of time includes a duration of time it takes for the resistor to one of pull up or pull down, in the opposite direction of the driver circuit, the voltage at the terminal.

17. The apparatus of claim 11 , wherein the driver circuit is a pull down circuit.

18. The apparatus of claim 17 , wherein if the resistor is not available, the arbiter circuit is further configured to wait a pull up time before again attempting to determine whether the resistor is available.

19. A method comprising:

detecting a voltage at a terminal coupled to a resistor;

determining whether the resistor is available based on the voltage;

enabling a driver circuit included in a chip for a duration of time based on timing information stored in a register included in the chip, wherein the timing information is unique to the chip among other chips;

pulling up or down the voltage for the duration of time; and

determining whether the resistor is available, based on the voltage, after the duration of time has elapsed.

20. The method of claim 19 further comprising:

transmitting an enable signal to a calibration circuit for a calibration operation responsive to determining that the resistor is available after the duration of time has elapsed.

Assignments (5)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050695/0825 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
SUPPLEMENT NO. 3 TO PATENT SECURITY AGREEMENT Recorded Feb 10, 2017
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041675/0105 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 30, 2016
From: PAN, DONG
To: MICRON TECHNOLOGY, INC.
Reel/Frame 040812/0485 →