IP Library Patent Application 10112976
Patent Application Utility
App. No. 10/112,976 · Confirmation No. 1850

A TEST STRUCTURE APPARATUS FOR MEASURING STANDBY CURRENT IN FLASH MEMORY DEVICES

Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗
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Code Description Pages PDF
2002-05-30 TRNA Transmittal of New Application 3 View
2002-05-30 DRW Drawings-only black and white line drawings 3 View
2002-03-28 TRNA Transmittal of New Application 5 View
2002-03-28 ADS Application Data Sheet 2 View
2002-03-28 SPEC Specification 5 View
2002-03-28 CLM Claims 3 View
2002-03-28 ABST Abstract 1 View
2002-03-28 DRW Drawings-only black and white line drawings 3 View
2002-03-28 OATH Oath or Declaration filed 2 View
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Quick Facts
App. No.
10/112,976
Filed
2002-03-28
Granted
2003-07-15
Examiner
LE, DUNG ANH
Art Unit
2819
PTA
0 days