Capacitor arrangement with capacitors arranged one in the other

1. An arrangement of at least two capacitors, the capacitor arrangement comprising:

at least two capacitors arranged one in the other such that an outer capacitor at least partially encloses at least one inner capacitor, the outer capacitor and the inner capacitor being arranged concentrically one in the other and comprising, from the outside inward, a first dielectric layer having a thickness d 1 , a first electrode layer having a thickness d 2 , a second dielectric layer having a thickness d 4 , a second electrode layer having a thickness d 5 +d 7 , a third dielectric layer having a thickness d 8 and an inner third electrode layer;

wherein the second electrode layer is at reference potential;

wherein the at least two capacitors are disposed in or on a semiconductor substrate;

wherein the outer capacitor and the inner capacitor have the same capacitance;

wherein the capacitor arrangement is formed as an arrangement of trench capacitors; and

wherein the first electrode layer extends above a structure depth T 1 along the wall of the trench and the second electrode layer is routed below the structure depth T 1 onto the semiconductor substrate.

2. The arrangement as in claim 1 , wherein the capacitors have an elliptical or circular cross section.

3. The arrangement as in claim 1 , wherein the first, the second and the third dielectric layers have the same thickness.

4. The arrangement as in claim 1 , wherein the capacitor arrangement is disposed within a trench in the semiconductor substrate, the arrangement further comprising a first contact to the first electrode layer and a third contact to the third electrode layer, first and third contacts being arranged at opposite sides of a periphery of the trench.

5. The arrangement as in claim 4 , wherein the first contact to the first electrode layer is arranged at an upper termination of the first electrode layer, wherein the upper termination of the first electrode layer is set back with respect to a surface of the substrate at a side of the trench periphery opposite to the first contact, so that a section that is not covered by the first electrode is obtained near the upper termination of the trench wall, and the third contact to the third electrode layer is routed through said section over the upper termination of the first electrode layer to outside of the capacitor arrangement.

6. An arrangement of two capacitors in a semiconductor substrate, in which an outer capacitor and an inner capacitor are arranged one in the other and the following are provided, from the outside inward:

a first dielectric layer, a first electrode layer, a second dielectric layer, a second electrode layer, a third dielectric layer and an inner third electrode layer,

wherein the first electrode layer extends only above a structure depth T 1 along the wall of a trench provided in the substrate, where the structure depth is measured from the surface of the substrate and T 1 is smaller than the depth of the trench,

and the second electrode layer is routed below the structure depth T 1 onto the semiconductor substrate and is at reference potential.

7. The arrangement as in claim 6 , wherein the outer and inner capacitors have an elliptical or circular cross section.

8. The arrangement as in claim 6 , wherein the outer capacitor and the inner capacitor have the substantially same capacitance.

9. The arrangement as in claim 6 , wherein the capacitors are arranged concentrically.

10. The arrangement as in claim 6 , wherein the outer capacitor and the inner capacitor have the same thickness.

11. The arrangement as in claim 10 , further comprising a first contact to the first electrode layer and a third contact to the third electrode layer, first and third contacts being arranged at opposite sides of a periphery of the trench.

12. The arrangement as in claim 11 , wherein the first contact to the first electrode layer is arranged at an upper termination of the first electrode layer, wherein the upper termination of the first electrode layer is set back with respect to a surface of the substrate at a side of the trench periphery opposite to the first contact, so that a section that is not covered by the first electrode is obtained near the upper termination of the trench wail, and the third contact to the third electrode layer is routed through said section over the upper termination of the first electrode layer to outside of the capacitor arrangement.

13. A capacitor arrangement comprising:

a semiconductor substrate;

a trench formed within the semiconductor substrate;

an inner electrode region disposed within the trench;

a first dielectric layer surrounding the inner electrode region;

a first electrode layer surrounding the first dielectric layer and extending along the inner electrode far a first distance;

a second dielectric layer surrounding the first electrode layer;

a second electrode layer surrounding the second dielectric layer and extending along the inner electrode for a second distance, the second distance being smaller than the first distance; and

a third dielectric layer surrounding the second electrode layer;

wherein the first dielectric, the first electrode layer, the second dielectric layer, the second electrode, and the third dielectric layer form an outer capacitor and an inner capacitor that are arranged concentrically within one in the other; and

wherein the first, the second and the third dielectric layers have the same thickness.

14. The arrangement as in claim 13 , wherein the first dielectric, the first electrode layer, the second dielectric layer, the second electrode, and the third dielectric layer are all disposed within a trench that is within a semiconductor region.

15. The arrangement as in claim 14 , wherein the first electrode is electrically coupled to the semiconductor region.

16. The arrangement as in claim 15 , wherein the first electrode is electrically coupled to the semiconductor region at a portion of the semiconductor region vertically below the second electrode.

17. The arrangement as in claim 15 , wherein the first electrode is electrically coupled to a reference potential.

18. The arrangement as in claim 14 , further comprising a first contact to the second electrode layer and a third contact to the inner electrode, the first and third contacts being arranged at opposite sides of a periphery of the trench.

19. The arrangement as in claim 18 , wherein the first contact to the first electrode layer is arranged at an upper termination of the first electrode layer, wherein the upper termination of the first electrode layer is set back with respect to a surface of the substrate at a side of the trench periphery opposite to the first contact, so that a section that is not covered by the first electrode is obtained near an upper termination of the trench wall, and wherein the third contact to the third electrode layer is routed through said section to outside of the capacitor arrangement.

20. The arrangement as in claim 13 , wherein the first electrode is electrically coupled to a reference potential.

21. The arrangement as in claim 13 , wherein the outer and inner capacitors have an elliptical or circular cross section.

22. An arrangement of two capacitors in a substrate, in which an outer capacitor and an inner capacitor are arranged one in the other and the following are provided, from the outside inward:

a first dielectric layer, a first electrode layer, a second dielectric layer, a second electrode layer, a third dielectric layer and an inner third electrode layer,

wherein the first electrode layer extends only above a structure depth T 1 along the wall of a trench provided in the substrate,

wherein the second electrode layer is routed below the structure depth T 1 onto the semiconductor substrate and is at reference potential, and

wherein the outer and inner capacitors have an elliptical or circular cross section.