Method and apparatus for performing turnaround testing on a digital signal 1 board
View Patent ↗A test adaptor for performing turnaround testing on a T1 board that has a plurality of jack receptacles disposed therein. The test adaptor is comprised of a bracket, a plurality of openings, and a plurality of test plugs. The bracket has a length and a width complimentary to the length and the width of an end of a T1 board. The plurality of openings disposed in the bracket are spaced apart from each other by predetermined distances that are complimentary to the spacing between the plurality of jack receptacles disposed in the T1 board. The plurality of test plugs are mounted within the plurality of openings in the bracket such that the plurality of test plugs can be engaged with the plurality of jack receptacles substantially simultaneously and with a single mechanical step.
1. A test adaptor for performing turnaround testing on a digital signal 1 board (T1 board) having a plurality of jack receptacles disposed therein comprising:
a bracket formed from a single, unitary structure, the bracket having a length and a width complimentary to a length and a width of an end of a T1 board;
a plurality of holes disposed in the bracket, the plurality of holes spaced within the bracket so as to be complimentary with the plurality of jack receptacles disposed in the T1 board; and
a plurality of test plugs mounted in respective ones of the plurality of holes in the bracket, a first end of each test plug extending past a first side of the bracket and a second end of each test plug extending past a second side of the bracket, wherein the plurality of test plugs can be engaged with the plurality of jack receptacles substantially simultaneously and with a single mechanical step, and wherein each of the test plugs is removably secured in its respective hole disposed in the bracket, the bracket remaining a single, unitary structure when any of the test plugs is mounted in or removed from the bracket.
2. The adaptor as in claim 1 wherein the bracket is rigid.
3. The adaptor as in claim 1 wherein the bracket is metal.
4. The adaptor as in claim 1 wherein the plurality of test plugs are turnaround plugs.
5. The adaptor as in claim 1 wherein the plurality of test plugs includes five plugs.
6. The adaptor as in claim 1 wherein the plugs are oriented along a linear axis of the bracket.
7. A combination of a digital signal 1 board (T1 board) and a test adaptor comprising:
an end of the T1 board having a plurality of jack receptacles disposed therein and spaced apart from each other, the end having a length and a width;
a bracket of the test adaptor formed from a single, unitary structure, the bracket having a length and a width complimentary to the length and the width of the end of the T1 board;
a plurality of holes disposed in the bracket, the plurality of holes in the bracket complimentarily spaced to the plurality of jack receptacles in the end of the T1 board; and
a plurality of test plugs mounted in respective ones of the plurality of holes in the bracket, a first end of each test plug extending past a first side of the bracket and a second ends of each test plug extending past a second side of the bracket such that the first end and second end of the test plugs are accessible when mounted in the bracket, wherein the plurality of test plugs are substantially simultaneously engaged with the plurality of jacks in a single mechanical step to test the plurality of jacks, and wherein each of the test plugs is removably secured in its respective hole disposed in the bracket, the bracket remaining a single, unitary structure when any of the test plugs is mounted in or removed from the bracket.
8. The adaptor as in claim 7 where the bracket is rigid.
9. The adaptor as in claim 7 wherein the bracket is metal.
10. The adaptor as in claim 7 wherein the plurality of plugs is turnaround plugs.
11. The adaptor as in claim 7 wherein the plurality of plugs includes five plugs.
12. The T1 board as in claim 7 wherein the T1 board is inserted into a chassis.
13. The adaptor as in claim 7 wherein the plugs are oriented along a linear axis of the bracket.
14. A method for testing a plurality of jacks in a digital signal 1 board (T1 board) comprising:
removably mounting a plurality of plugs in respective ones of a plurality of holes, the plurality of holes disposed in a bracket formed from a single, unitary structure, the bracket remaining a single, unitary structure when any of the plugs are mounted in or removed from their respective holes, the plurality of holes spaced apart from each other, a first end of each plug extending past a first side of the bracket and a second ends of each plug extending past a second side of the bracket;
aligning the first ends of the plurality of plugs with a plurality of jack receptacles, the plurality of jack receptacles disposed in an end of a T1 board, the plurality of jack receptacles spaced apart from each other;
engaging the first ends of the aligned plurality of plugs with the plurality of jack receptacles substantially simultaneously and with a single mechanical step such that each plug is capable of receiving a transmit signal from the jack receptacle with which it is engaged and transmitting a return signal back to the jack receptacle, the return signal being identical to the transmit signal; and
disengaging the first ends of the plurality of plugs disposed in the bracket from the plurality of jack receptacles at the end of the testing process.
15. The method as in claim 14 wherein the bracket is rigid.
16. The method as in claim 14 wherein the bracket is metal.
17. The method as in claim 14 wherein the plurality of test plugs are turnaround plugs.
18. The method as in claim 14 wherein the plurality of test plugs includes five plugs.
19. The method as in claim 14 wherein mounting a plurality of plugs further comprises mounting the plurality of plugs along a linear axis of the bracket.