Semiconductor device and method of forming integrated passive device module
A method of manufacturing a semiconductor device includes providing a substrate with an insulation layer disposed on a top surface of the substrate, forming a passive device over the top surface of the substrate, removing the substrate, depositing an insulating polymer film layer over the insulation layer, and depositing a metal layer over the insulating polymer film layer. A solder mask can be formed over the metal layer. A conformal metal layer can then be formed over the solder mask. A notch can be formed in the insulation layer to enhance the connection between the insulating polymer film layer and the insulation layer. Additional semiconductor die can be electrically connected to the passive device. The substrate is removed by removing a first amount of the substrate using a back grind process, and then removing a second amount of the substrate using a wet dry, dry etch, or chemical-mechanical planarization process.
1. A method of manufacturing a semiconductor device, comprising:
providing a first temporary substrate with an insulation layer disposed on a top surface of the first temporary substrate;
forming an integrated passive circuit over a first surface of the insulation layer by,
(a) forming a first conductive layer over the first surface of the insulation layer,
(b) forming a dielectric layer over the first conductive layer, and
(c) forming a second conductive layer over the dielectric layer;
mounting a second temporary substrate over the integrated passive circuit;
removing the first temporary substrate;
depositing an insulating polymer film layer over a second surface of the insulation layer opposite the first surface of the insulation layer;
forming an interconnect structure over the insulating polymer film layer; and
removing the second temporary substrate.
2. The method of claim 1 , including bonding a permanent support substrate to the semiconductor device.
3. The method of claim 1 , including electrically connecting a semiconductor die to the integrated passive circuit.
4. The method of claim 1 , including:
etching a notch into the insulation layer; and
depositing a portion of the insulating polymer film layer into the notch.
5. The method of claim 1 , wherein removing the temporary substrate includes:
removing a first amount of the temporary substrate using a grinding process; and
removing a second amount of the temporary substrate using a wet dry, dry etch, or chemical-mechanical planarization process.
6. A method of manufacturing a semiconductor device, comprising:
providing a temporary substrate with an insulation layer disposed on a top surface of the temporary substrate;
forming an integrated passive circuit over a first surface of the insulation layer by forming a conductive layer wound to exhibit inductive properties over the first surface of the insulation layer;
removing the temporary substrate; and
mounting a printed circuit board over a second surface of the insulation layer opposite the first surface of the insulation layer, wherein the printed circuit board includes:
an insulating polymer film layer, and
an interconnect structure formed over the insulating polymer film layer.
7. The method of claim 6 , including depositing a wafer carrier over the integrated passive circuit.
8. The method of claim 6 , including bonding a permanent support substrate to the semiconductor device.
9. The method of claim 6 , including electrically connecting a semiconductor die to the integrated passive circuit.
10. The method of claim 6 , including:
etching a notch into the insulation layer; and
depositing an insulating polymer film into the notch.
11. The method of claim 6 , wherein the step of removing the temporary substrate includes:
removing a first amount of the temporary substrate using a grinding process; and
removing a second amount of the temporary substrate using a wet dry, dry etch, or chemical-mechanical planarization process.
12. A method of manufacturing a semiconductor device, comprising:
providing a temporary substrate having an insulation layer disposed on a top surface of the temporary substrate;
forming an integrated passive circuit over a first surface of the insulation layer by:
depositing a conductive layer over the first surface of the insulation layer, and
depositing a dielectric layer over the conductive layer;
forming a passivation layer over the integrated passive circuit;
etching a first opening in the passivation layer to expose a first surface of the integrated passive circuit;
removing the temporary substrate;
etching a first opening in the insulation layer to expose a second surface of the integrated passive circuit;
depositing an insulating polymer film over a second surface of the insulation layer opposite the first surface of the insulation layer; and
forming a conductive layer over the insulating polymer film, wherein the conductive layer contacts the second surface of the integrated passive circuit.
13. The method of claim 12 , including electrically connecting a semiconductor die to the exposed first surface of the integrated passive circuit.
14. The method of claim 12 , wherein removing the temporary substrate includes:
removing a first amount of the temporary substrate using a grinding process; and
removing a second amount of the temporary substrate using a wet dry, dry etch, or chemical-mechanical planarization process.
15. The method of claim 12 , including forming a solder mask over the conductive layer.
16. The method of claim 12 , including:
etching a notch into the insulation layer; and
depositing a portion of the insulating polymer film into the notch.
17. The method of claim 13 , including depositing molding material over the exposed first surface of the integrated passive circuit and semiconductor die.
18. The method of claim 15 , including forming a conformal conductive layer underneath the solder mask, the conformal conductive layer penetrating the insulating polymer film.
19. A method of manufacturing a semiconductor device, comprising:
providing a temporary substrate with an insulation layer deposited on a top surface of the temporary substrate;
forming an integrated passive circuit over a first surface of the insulation layer;
removing the temporary substrate;
depositing an insulating polymer film layer over a second surface of the insulation layer opposite the first surface of the insulation layer;
depositing an interconnect structure over the insulating polymer film layer; and
bonding a wafer carrier over the integrated passive circuit.
20. A method of manufacturing a semiconductor device, comprising:
providing a temporary substrate with an insulation layer deposited on a top surface of the temporary substrate;
forming an integrated passive circuit over a first surface of the insulation layer;
removing the temporary substrate;
depositing an insulating polymer film layer over a second surface of the insulation layer opposite the first surface of the insulation layer;
depositing an interconnect structure over the insulating polymer film layer; and
bonding a permanent support substrate to the semiconductor device.
21. The method of claim 19 , including electrically connecting a semiconductor die to the integrated passive circuit.
22. A method of manufacturing a semiconductor device, comprising:
providing a temporary substrate with an insulation layer deposited on a top surface of the temporary substrate;
forming an integrated passive circuit over a first surface of the insulation layer;
removing the temporary substrate by,
(a) removing a first amount of the temporary substrate using a grinding process, and
(b) removing a second amount of the temporary substrate using a wet dry, dry etch, or chemical-mechanical planarization process;
depositing an insulating polymer film layer over a second surface of the insulation layer opposite the first surface of the insulation layer; and
depositing an interconnect structure over the insulating polymer film layer.