Memory device and methods for its fabrication
View Patent ↗A semiconductor memory device and a method for its fabrication are provided. In accordance with one embodiment of the invention the method comprises the steps of forming a gate insulator and a gate electrode overlying a semiconductor substrate. The gate insulator is etched to form an undercut opening beneath an edge of the gate electrode and the undercut opening is filled with a layered structure comprising a charge trapping layer sandwiched between layers of oxide and nitride. A region of the semiconductor substrate is impurity doped to form a bit line aligned with the gate electrode, and a conductive layer is deposited and patterned to form a word line coupled to the gate electrode.
1. A nonvolatile semiconductor memory device comprising:
a semiconductor substrate;
first and second layered stacks on the semiconductor substrate, each of the layered stacks comprising spatially sequential layers of oxide, nitride, polycrystalline silicon, nitride, and oxide;
a gate insulator positioned between the first and second layered stacks; and
a control gate overlying the layered stacks and the gate insulator.
2. The nonvolatile semiconductor memory device of claim 1 wherein each of the first and second layered stacks is positioned in an undercut region under an edge of the control gate.
3. The nonvolatile semiconductor memory device of claim 2 further comprising first and second bit lines formed in the semiconductor substrate and a word line overlying and electrically coupled to the control gate.
4. The nonvolatile semiconductor memory device of claim 1 wherein the sequential layers have a first effective oxide thickness and wherein the gate insulator has a second effective oxide thickness greater than the first effective oxide thickness.
5. A nonvolatile semiconductor memory comprising:
a semiconductor substrate;
a stack structure on the semiconductor substrate, the stack comprising;
a layer of tunnel oxide;
nitride on the tunnel oxide;
a charge trapping layer on the nitride;
nitride on the charge trapping layer; and
oxide on the nitride; and
a control gate overlying the stack structure.