IP Library Granted Patent US 8,008,121
Granted Patent B2
US 8,008,121 · App. 12/612,365 · Granted Aug 30, 2011

Semiconductor package and method of mounting semiconductor die to opposite sides of TSV substrate

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Quick Facts
Patent No.
US 8,008,121
App. No.
12/612,365
Granted
Aug 30, 2011
Kind
B2
Abstract

A semiconductor package has a first conductive via formed through a substrate. The substrate with first conductive via is mounted to a first carrier. A first semiconductor die is mounted to a first surface of the substrate. A first encapsulant is deposited over the first die and first carrier. The first carrier is removed. The first die and substrate with the first encapsulant is mounted to a second carrier. A second semiconductor die is mounted to a second surface of the substrate opposite the first surface of the substrate. A second encapsulant is deposited over the second die. The second carrier is removed. A bump is formed over the second surface of the substrate. A conductive layer can be mounted over the first die. A second conductive via can be formed through the first encapsulant and electrically connected to the first conductive via. The semiconductor packages are stackable.

Claims (36)

1. A method of making a semiconductor package, comprising:

providing a wafer level substrate;

forming a plurality of vias through the wafer level substrate;

depositing conductive material in the vias to form first conductive vias through the wafer level substrate;

providing a first carrier;

mounting the wafer level substrate with first conductive vias to the first carrier;

mounting a first semiconductor die to a first surface of the wafer level substrate;

depositing a first encapsulant over the first semiconductor die and first carrier;

removing the first carrier;

providing a second carrier;

mounting the first semiconductor die and wafer level substrate with the first encapsulant to the second carrier;

mounting a second semiconductor die to a second surface of the wafer level substrate opposite the first surface of the wafer level substrate;

depositing a second encapsulant over the second semiconductor die; and

removing the second carrier.

2. The method of claim 1 , further including forming a plurality of bumps over the second surface of the wafer level substrate.

3. The method of claim 1 , further including mounting a conductive layer over the first semiconductor die.

4. The method of claim 1 , further including forming a plurality of second conductive vias through the first encapsulant, the second conductive vias being electrically connected to the first conductive vias.

5. The method of claim 1 , further including forming a plurality of bumps over the first conductive vias prior to depositing the first encapsulant.

6. The method of claim 1 , further including stacking a plurality of semiconductor packages each containing the first and second semiconductor die mounted to the first and second surfaces of the wafer level substrate.

7. The method of claim 1 , further including stacking a plurality of semiconductor packages each containing the first semiconductor die mounted to the first surface of the wafer level substrate.

8. A method of making a semiconductor package, comprising:

providing a substrate;

forming a first conductive via through the substrate;

mounting the substrate with first conductive via to a first carrier;

mounting a first semiconductor die to a first surface of the substrate;

depositing a first encapsulant over the first semiconductor die and first carrier;

removing the first carrier;

mounting the first semiconductor die and substrate with the first encapsulant to a second carrier;

mounting a second semiconductor die to a second surface of the substrate opposite the first surface of the substrate;

depositing a second encapsulant over the second semiconductor die; and

removing the second carrier.

9. The method of claim 8 , further including forming a bump over the second surface of the substrate.

10. The method of claim 8 , further including mounting a conductive layer over the first semiconductor die.

11. The method of claim 8 , further including forming a second conductive via through the first encapsulant, the second conductive via being electrically connected to the first conductive via.

12. The method of claim 8 , further including forming a bump over the first conductive via prior to depositing the first encapsulant.

13. The method of claim 8 , further including stacking a plurality of semiconductor packages each containing the first and second semiconductor die mounted to the first and second surfaces of the substrate.

Assignments (6)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 3, 2025
From: STATS CHIPPAC PTE. LTD.
To: STATS CHIPPAC MANAGEMENT PTE. LTD.
Reel/Frame 072788/0917 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE'S NAME PREVIOUSLY RECORDED AT REEL: 038378 FRAME: 0301. ASSIGNOR(S) HEREBY CONFIRMS THE CHANGE OF NAME. Recorded Aug 31, 2023
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTD.
Reel/Frame 064913/0352 →
RELEASE OF SECURITY INTEREST Recorded Jun 11, 2020
From: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
To: STATS CHIPPAC, INC.; STATS CHIPPAC PTE. LTD. FORMERLY KNOWN AS STATS CHIPPAC LTD.
Reel/Frame 052907/0650 →
CHANGE OF NAME Recorded Apr 7, 2016
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTE.
Reel/Frame 038378/0301 →
SECURITY INTEREST Recorded Aug 6, 2015
From: STATS CHIPPAC, INC.; STATS CHIPPAC LTD.
To: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
Reel/Frame 036288/0748 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 4, 2009
From: CHOI, DAESIK; KIM, JONGHO; LEE, HYUNGMIN
To: STATS CHIPPAC, LTD.
Reel/Frame 023469/0706 →