Non-volatile memory and method with improved sensing having bit-line lockout control
View Patent ↗In sensing a group of cells in a multi-state nonvolatile memory, multiple sensing cycles relative to different demarcation threshold levels are needed to resolve all possible multiple memory states. Each sensing cycle has a sensing pass. It may also include a pre-sensing pass or sub-cycle to identify the cells whose threshold voltages are below the demarcation threshold level currently being sensed relative to. These are higher current cells which can be turned off to achieve power-saving and reduced source bias errors. The cells are turned off by having their associated bit lines locked out to ground. A repeat sensing pass will then produced more accurate results. Circuitry and methods are provided to selectively enable or disable bit-line lockouts and pre-sensing in order to improving performance while ensuring the sensing operation does not consume more than a maximum current level.
1. A nonvolatile memory, comprising:
an array of memory cells accessible by bit lines and word lines;
a group of sensing circuits for sensing conduction currents in a corresponding group of memory cells in parallel wherein individual memory cells of the group as accessible by associated bit lines and a common word line;
a set of control signals for controlling the group of sensing circuits to sense the group of memory cells in parallel relative to a selected demarcation threshold voltage; and
a bit-line grounding circuit for each sensing circuit to ground the associated bit line responsive to both a sense result of said each sensing circuit and a control signal for selectively disabling or enabling bit-line lockout during sensing.
2. The nonvolatile memory as in claim 1 , wherein:
the sense result is when the memory cell being sensed has a conduction current higher than a reference sense current; and
the control signal is asserted when an enabling condition for bit-line lockout is satisfied.
3. The nonvolatile memory as in claim 2 , wherein:
the enabling condition for bit-line lockout includes when an aggregated current of the group of memory cells reaches a predetermined current level.
4. The nonvolatile memory as in claim 2 , wherein:
the enabling condition for bit-line lockout includes when the number of memory cells having the sense result reaches a predetermined number.
5. The nonvolatile memory as in claim 2 , further comprising:
a bit line voltage supply; and wherein:
the bit line voltage supply supplies a predetermined minimum bit line voltage during sensing.
6. The nonvolatile memory as in claim 2 , further comprising:
a word line voltage supply; and wherein:
the word line voltage supplies to a selected word line a selected demarcation threshold voltage level relative to which the sensing is to be performed;
the enabling condition for bit-line lockout includes when the selected demarcation threshold voltage level coincides with a predetermined level among a subset of a set of multiple threshold voltage levels.
7. The nonvolatile memory as in claim 6 , wherein:
the subset is formed by selecting substantially equally spaced apart demarcation threshold voltage levels among the set of multiple threshold voltage levels.
8. The nonvolatile memory as in claim 7 , wherein:
the group of memory cells stores data coded in a pseudo-random pattern.
9. The nonvolatile memory as in claim 6 , wherein:
the subset is a selection of every n demarcation threshold levels among an ordered set of multiple threshold voltage levels, and n is an integer greater than one.
10. The nonvolatile memory as in claim 6 , wherein:
the subset contains at least three voltage levels.
11. The nonvolatile memory as in claim 6 , wherein:
the subset contains at least seven voltage levels.
12. The nonvolatile memory as in claim 6 , wherein:
the subset contains at least fifteen voltage levels.
13. The nonvolatile memory as in claim 1 , wherein said group of sensing circuits is operated in a read operation to read memory states programmed into said group of memory cells.
14. The nonvolatile memory as in claim 6 , wherein said group of sensing circuits is operated in a part of a program operation to verify if any of the memory cells has been programmed relative to the selected demarcation threshold voltage.
15. The nonvolatile memory as in claim 1 , wherein the corresponding group of memory cells is a portion of a flash EEPROM.
16. The nonvolatile memory as in claim 15 , wherein the flash EEPROM is of NAND type.
17. The nonvolatile memory as in claim 1 , wherein memory cells of the corresponding group of memory cells each has at least one charge storage element.
18. The nonvolatile memory as in claim 17 , wherein the charge storage element is a floating gate.
19. The nonvolatile memory as in claim 16 , wherein the charge storage element is a dielectric layer.
20. The nonvolatile memory as in claim 1 , wherein memory cells of the corresponding group of memory cells each stores at least two bits of data.