AD HOC flash memory reference cells

1. A method of managing a flash memory that includes a plurality of primary cells and a plurality of spare cells, the method comprising:

(a) interrogating the flash memory to determine which spare cells have been used to replace respective primary cells;

(b) using, as reference cells, at least a portion of a remainder of the spare cells; and

(c) assigning any unused primary cells of the flash memory as reference cells, the unused primary cells increasing number of the reference cells available within the flash memory.

2. The method of claim 1 , wherein the flash memory includes a memory cell array, the memory cell array includes,

(a) a data section configured for storing user data;

(b) a control section configured for storing control and management information for the user data in the data section; and

(c) a redundant section configured to compensate bad bit lines in the data section and the control section,

wherein cells in the data and control sections are the primary cells and cells in the redundant section are the spare cells.

3. The method of claim 2 , wherein interrogating the flash memory further includes,

retrieving column remapping information recorded in the flash memory, the column remapping information identifying bit lines from the redundant section that replaced bad bit lines detected during initial testing of the flash memory, the bit lines from the redundant section used for storing user data or control and management information that were being stored in the bad bit lines; and

identifying unused spare cells on the bit lines from the redundant section of the memory cell array, the unused spare cells used as reference cells of the memory cell array; and

providing access to the reference cells on the bit lines of the redundant section.

4. The method of claim 2 ,

wherein the unused primary cells belong to any one or both of the data section and the control section of the memory cell array.

5. The method of claim 2 , wherein interrogating the flash memory further includes,

examining the memory cell array of the flash memory to determine logical types of blocks distributed within, wherein each of the different logical types of blocks has distinct requirements for storing the control and management information, the different logical types of blocks include blocks of single level cells and blocks of multi-level cells;

when the memory cell array includes different logical types of blocks,

identifying layout of the different logical types of blocks within a same plane of the memory cell array of the flash memory; and

assigning cells from the unused bit lines of particular ones of logical types of blocks as reference cells, the cells from the unused bit lines increasing number of the reference cells of the memory cell array, wherein the particular ones of the logical types of blocks include single level cells.

6. The method of claim 1 , wherein the reference cells are not pre-assigned.

7. The method of claim 1 , wherein the reference cells are not located on dedicated bit lines.

8. A flash memory device comprising:

(a) a flash memory including a plurality of primary cells and a plurality of spare cells, wherein the flash memory includes a memory cell array having a data section, a control section and a redundant section; and

(b) a controller operative:

(i) to interrogate the flash memory to determine which spare cells have been used to replace respective primary cells;

(ii) to use, as reference cells, at least a portion of a remainder of the spare cells; and

(iii) to assign any unused primary cells from any one or both of the data section and the control section of the memory cell array as reference cells, the unused primary cells increasing number of the reference cells available in the flash memory.

9. The flash memory device of claim 8 , wherein the controller and the memory cell array of the flash memory being integrated into one or more integrated circuit chips.

10. The flash memory device of claim 8 , wherein

(a) the data section of the memory cell array is used for storing user data;

(b) the control section of the memory cell array is used for storing control and management information for the user data in the data section; and

(c) the redundant section of the memory cell array is used to compensate bad bit lines in the data section and the control section,

wherein cells in the data and control sections are the primary cells and cells in the redundant section are the spare cells.

11. The flash memory device of claim 8 , wherein the controller, during interrogation of the flash memory, is further operative to,

obtain column remapping information recorded in the flash memory, the column remapping information identifies bit lines from the redundant section that replaced bad bit lines detected during initial testing of the flash memory, the bit lines from the redundant section used for storing user data or control and management information that were being stored in the bad bit lines;

identify unused spare cells on the bit lines from the redundant section of the memory cell array, the unused spare cells used as reference cells of the memory cell array; and

provide access to the reference cells on the bit lines of the redundant section.

12. The flash memory device of claim 8 , wherein the controller is further operative to,

examine the memory cell array of the flash memory to determine logical types of blocks distributed within, each of the different logical types of blocks has different requirements for storing the control and management information, the different logical types of blocks include single level cells and multi-level cells;

when the memory cell array includes different logical types of blocks,

identify layout of the different logical types of blocks within a same plane of the memory cell array of the flash memory; and

assign cells from the unused bit lines of particular ones of logical types of blocks as reference cells, the cells from the unused bit lines increasing number of the reference cells of the memory cell array, wherein the particular ones of the logical types of blocks include single level cells.

13. A system, comprising:

(a) a flash memory including a plurality of primary cells and a plurality of spare cells, wherein the flash memory includes a memory cell array having a data section, a control section and a redundant section; and

(b) a host, of the flash memory, including:

(i) a memory for storing code for managing the flash memory by steps including:

(A) interrogating the flash memory to determine which spare cells have been used to replace respective primary cells,

(B) using, as reference cells, at least a portion of a remainder of the spare cells;

(C) assigning any unused primary cells from any one or both of the data section and the control section of the memory cell array as reference cells, the unused primary cells increasing number of the reference cells available in the flash memory; and

(ii) a processor for executing the code.

14. The system of claim 13 , wherein

(a) the data section of the memory cell array is used for storing user data;

(b) the control section of the memory cell array is used for storing control and management information for the user data in the data section; and

(c) the redundant section of the memory cell array is used to compensate bad bit lines in the data section and the control section,

wherein cells in the data and control sections are the primary cells and cells in the redundant section are the spare cells.

15. The system of claim 13 , wherein the code for interrogating the flash memory further includes the steps for,

retrieving column remapping information recorded in the flash memory, the column remapping information identifies bit lines from the redundant section that replaced bad bit lines detected during initial testing of the flash memory, the bit lines from the redundant section used for storing user data or control and management information that were being stored in the bad bit lines;

identifying unused spare cells on the bit lines from the redundant section of the memory cell array, the unused spare cells used as reference cells of the memory cell array; and

providing access to the reference cells on the bit lines of the redundant section.

16. The system of claim 13 , wherein the code for interrogating the flash memory further includes the steps for,

examining the memory cell array of the flash memory to determine logical types of blocks distributed within, wherein each of the different logical types of blocks has distinct requirements for storing the control and management information, the different logical types of blocks include single level cells and multi-level cells;

when the memory cell array includes different logical types of blocks,

identifying layout of the different logical types of blocks within a same plane of the memory cell array of the flash memory; and

assigning cells from the unused bit lines of particular ones of logical types of blocks as reference cells, the cells from the unused bit lines increasing number of the reference cells of the memory cell array, wherein the particular ones of the logical types of blocks include single level cells.