IP Library Granted Patent US 9,543,025
Granted Patent B2
US 9,543,025 · App. 13/861,326 · Granted Jan 10, 2017

Storage control system with power-off time estimation mechanism and method of operation thereof

Inventors: James Fitzpatrick (Sudbury, MA); James M. Higgins (Chandler, AZ); Bernardo Rub (Sudbury, MA); Ryan Jones (Mesa, AZ); Robert W. Ellis (Phoenix, AZ); Mark Dancho (Chandler, AZ); Sheunghee Park (Pleasanton, CA)
Assignee: SANDISK TECHNOLOGIES LLC
G11C16/20G06F12/0246G11C16/349G11C16/3418
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,543,025
App. No.
13/861,326
Granted
Jan 10, 2017
Kind
B2
Abstract

A storage control system, and a method of operation thereof, including: a power-down module for powering off a memory sub-system; a decay estimation module, coupled to the power-down module, for estimating a power-off decay rate upon the memory sub-system powered up, the power-off decay rate is for indicating how much data in the memory sub-system has decayed while the memory sub-system has been powered down; and a recycle module, coupled to the decay estimation module, for recycling an erase block for data retention based on the power-off decay rate.

Claims (40)

1. A method of operation of a storage control system comprising:

powering off a memory sub-system;

estimating power-off decay in respective blocks of a set of blocks of the memory sub-system upon the memory sub-system powering up, wherein the estimated power-off decay for a particular block is a numerical value indicating how much data in the particular block of the memory sub-system has decayed while the memory sub-system has been powered down, and the estimated power-off decay for the particular block is calculated as a function of a difference between a pre-power-down threshold voltage and a post-power-up threshold voltage; and

identifying blocks in the memory sub-system for which the estimated power-off decay has reached a threshold and recycling at least the identified blocks in the memory sub-system for data retention;

wherein estimating power-off decay includes calculating a power-off time for indicating how long the memory sub-system has been powered off and estimating the power-off decay as a function of the power-off time.

2. The method as claimed in claim 1 , wherein estimating includes:

in accordance with an identification of oldest data in the set of blocks, identifying an age of the oldest data in the set of blocks;

estimating data retention of the oldest data in the set of blocks based on the identified age of the oldest data in the set of blocks, the oldest data comprising data least recently written to the set of blocks;

determining, based on the estimated data retention of the oldest data, that the oldest data is at risk of data loss;

in accordance with determining that the oldest data is at risk of data loss, flagging the oldest data for data retention recycling; and

repeating the estimating, determining, and flagging with respect to a plurality of additional erase blocks in the memory sub-system, in an order corresponding to oldest-to-freshest data stored in the memory sub-system, until identifying an erase block that is not at risk of data loss.

3. The method as claimed in claim 1 , wherein estimating includes:

in accordance with an identification of freshest data in the set of blocks, identifying an age of the freshest data in the set of blocks;

estimating data retention of freshest data in the set of blocks based on the identified age of the freshest data in the set of blocks, the freshest data comprising data most recently written to the set of blocks; and

using the data retention of the freshest data to estimate data retention of other erase blocks.

4. The method as claimed in claim 1 , wherein estimating includes: estimating an error rate of surrogate data as a measure of data retention for the memory sub-system, wherein the surrogate data is stored in a portion of a memory device set aside for measuring data retention.

5. The method as claimed in claim 1 , wherein estimating the power-off decay comprises estimating the power-off decay as a function of time and temperature.

6. The method as claimed in claim 1 , wherein estimating the power-off decay includes obtaining a power-up date and time by querying a host system and calculating a power-off time for indicating how long the memory sub-system has been powered off, the power-off time based on the obtained power-up date and time.

7. The method as claimed in claim 1 , wherein estimating the power-off decay includes obtaining a power-up date and time by querying a real-time clock self-powered in the memory sub-system and calculating a power-off time for indicating how long the memory sub-system has been powered off, the power-off time based on the obtained power-up date and time.

8. The method as claimed in claim 1 , wherein the recycling includes accelerating movement of the identified blocks through a write queue.

9. A storage control system comprising:

a power-down module configured to power off a memory sub-system;

a decay estimation module, coupled to the power-down module, configured to estimate power-off decay in respective blocks of a set of blocks of the memory sub-system upon the memory sub-system powering up, wherein the estimated power-off decay for a particular block is a numerical value indicating how much data in the particular block of the memory sub-system has decayed while the memory sub-system has been powered down, and the estimated power-off decay for the particular block is calculated as a function of a difference between a pre-power-down threshold voltage and a post-power-up threshold voltage; and

a recycle module, coupled to the decay estimation module, configured to identify blocks in the memory sub-system for which the estimated power-off decay has reached a threshold and recycling at least the identified blocks in the memory sub-system for data retention;

wherein the decay estimation module is configured to calculate a power-off time for indicating how long the memory sub-system has been powered off and estimating the power-off decay as a function of the power-off time.

10. The system as claimed in claim 9 , wherein the decay estimation module is for:

identifying an age of the oldest data in the set of blocks in accordance with an identification of oldest data in the set of blocks;

estimating data retention of the oldest data in the set of blocks based on the identified age of the oldest data in the set of blocks, the oldest data comprising data least recently written to the set of blocks;

determining, based on the estimated data retention of the oldest data, that the oldest data is at risk of data loss;

in accordance with determining that the oldest data is at risk of data loss, flagging the oldest data for data retention recycling; and

repeating the estimating, determining, and flagging with respect to a plurality of additional erase blocks in the memory sub-system, in an order corresponding to oldest-to-freshest data stored in the memory sub-system, until identifying an erase block that is not at risk of data loss.

11. The system as claimed in claim 9 , wherein the decay estimation module is for:

identifying an age of the freshest data in the set of blocks in accordance with an identification of freshest data in the set of blocks;

estimating data retention of freshest data in the set of blocks based on the identified age of the freshest data in the set of blocks, the freshest data comprising data most recently written to the set of blocks; and

using the data retention of the freshest data to estimate data retention of other erase blocks.

12. The system as claimed in claim 9 , wherein the decay estimation module is for estimating an error rate of surrogate data as a measure of data retention for the memory sub-system, wherein the surrogate data is stored in a portion of a memory device set aside for measuring data retention.

13. The system as claimed in claim 9 , wherein the decay estimation module is for estimating the power-off decay as a function of the power-off time and temperature.

14. The system as claimed in claim 13 , wherein the decay estimation module is for obtaining a power-up date and time by querying a host system and calculating the power-off time for indicating how long the memory sub-system has been powered off, the power-off time based on the obtained power-up date and time.

15. The system as claimed in claim 13 , wherein the decay estimation module is for obtaining a power-up date and time by querying a real-time clock self-powered in the memory sub-system and calculating the power-off time for indicating how long the memory sub-system has been powered off, the power-off time based on the obtained power-up date and time.

16. The system as claimed in claim 9 , wherein the recycle module is for accelerating movement of the identified blocks through a write queue.

Assignments (6)
SECURITY AGREEMENT Recorded Apr 25, 2025
From: SANDISK TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 071050/0001 →
PARTIAL RELEASE OF SECURITY INTERESTS Recorded Apr 25, 2025
From: JPMORGAN CHASE BANK, N.A., AS AGENT
To: SANDISK TECHNOLOGIES, INC.
Reel/Frame 071382/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 31, 2024
From: SANDISK TECHNOLOGIES LLC
To: SANDISK TECHNOLOGIES, INC.
Reel/Frame 069796/0423 →
CHANGE OF NAME Recorded May 25, 2016
From: SANDISK TECHNOLOGIES INC
To: SANDISK TECHNOLOGIES LLC
Reel/Frame 038807/0807 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 29, 2016
From: SMART STORAGE SYSTEMS, INC
To: SANDISK TECHNOLOGIES INC.
Reel/Frame 038290/0033 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 11, 2013
From: FITZPATRICK, JAMES; HIGGINS, JAMES M.; RUB, BERNARDO; JONES, RYAN; ELLIS, ROBERT W.; DANCHO, MARK; PARK, SHEUNGHEE
To: SMART STORAGE SYSTEMS, INC.
Reel/Frame 030201/0110 →
Continuity (1)
Related Publication 20140310445A1 · Oct 16, 2014