Test structures for dielectric reliability evaluations
Methods and test structures for testing the reliability of a dielectric material. The test structure may include a first row of contacts and a line comprised of a conductor. The line is laterally spaced in a direction at a minimum distance from the first row of contacts. The test structure further includes a second row of contacts laterally spaced in the direction from the first row of contacts by a distance equal to two times a minimum pitch. The line is laterally positioned between the first row of contacts and the second row of contacts.
1. A structure for testing reliability of a dielectric material, the structure comprising:
a first row of contacts;
a first linear feature comprised of a conductor, the first linear feature laterally spaced in a first direction at a minimum distance from the first row of contacts; and
a second row of contacts laterally spaced in the first direction from the first row of contacts by a distance equal to two times a minimum pitch,
wherein the first row of contacts includes a first plurality of contacts, the second row of contacts includes a second plurality of contacts, the first plurality of contacts and the second plurality of contacts are comprised of a conductive material, and the first linear feature is laterally positioned between the first row of contacts and the second row of contacts.
2. The structure of claim 1 further comprising:
a dielectric layer comprised of the dielectric material,
wherein a portion of the dielectric material of the dielectric layer is located between the first linear feature and the first row of contacts.
3. The structure of claim 1 further comprising:
a dielectric layer comprised of the dielectric material,
wherein a portion of the dielectric material of the dielectric layer is located between the first linear feature and the second row of contacts.
4. The structure of claim 1 wherein a first space between the first linear feature and the second row of contacts is free of additional linear features of the conductor and additional rows of contacts.
5. The structure of claim 4 wherein the first space comprises a first area, and the first linear feature and the first row of contacts occupy a second space having a second area equal to the first area.
6. The structure of claim 5 further comprising:
a dielectric layer comprised of the dielectric material,
wherein a portion of the dielectric material of the dielectric layer is located between the first linear feature and the first row of contacts.
7. The structure of claim 5 further comprising:
a third row of contacts; and
a third linear feature comprised of the conductor, the third linear feature laterally spaced in the first direction at the minimum distance from the third row of contacts,
wherein the third row of contacts and the third linear feature occupy a third space that is equal in size to the second space and that is laterally spaced in a second direction perpendicular to the second space.
8. The structure of claim 7 further comprising:
a dielectric layer comprised of the dielectric material,
wherein a first portion of the dielectric material of the dielectric layer is located between the first linear feature and the first row of contacts, and a second portion of the dielectric material of the dielectric layer is located between the third linear feature and the third row of contacts.
9. The structure of claim 5 further comprising:
a second linear feature comprised of the conductor, the second linear feature laterally spaced at the minimum distance from the second row of contacts,
wherein the second linear feature and the second row of contacts occupy a third space having a third area equal to the second area.
10. The structure of claim 9 further comprising:
a dielectric layer comprised of the dielectric material,
wherein a first portion of the dielectric material of the dielectric layer is located between the first linear feature and the first row of contacts, and a second portion of the dielectric material of the dielectric layer is located between the second linear feature and the second row of contacts.
11. The structure of claim 1 further comprising:
a second linear feature comprised of the conductor, the second linear feature laterally spaced at the minimum distance from the second row of contacts.
12. The structure of claim 1 further comprising:
a first pad coupled with the first linear feature;
a second pad coupled with the first row of contacts; and
a third pad coupled with the second row of contacts,
wherein the second pad and the third pad are coupled in parallel.
13. The structure of claim 12 further comprising:
a second linear feature comprised of the conductor, the second linear feature laterally spaced at the minimum distance from the second row of contacts; and
a fourth pad coupled with the second linear feature,
wherein the first pad and the fourth pad are coupled in parallel.
14. The structure of claim 1 wherein the first linear feature comprises polysilicon for a gate of a field-effect transistor, and further comprising:
a dielectric layer comprised of the dielectric material,
wherein a first portion of the dielectric material of the dielectric layer is located between the first linear feature and the first row of contacts, and the first plurality of contacts in the first row of contacts comprise the conductive material deposited in a plurality of vias defined in the dielectric layer.
15. A method for forming a structure used to test reliability of a dielectric material, the method comprising:
forming a first row of contacts;
forming a first linear feature comprised of a conductor, the first linear feature laterally spaced in a first direction at a minimum distance from the first row of contacts; and
forming a second row of contacts laterally spaced in the first direction from the first row of contacts by a distance equal to two times a minimum pitch,
wherein the first row of contacts includes a first plurality of contacts and the second row of contacts includes a second plurality of contacts, the first plurality of contacts and the second plurality of contacts are comprised of a conductive material, and the first linear feature is laterally positioned between the first row of contacts and the second row of contacts.
16. The method of claim 15 further comprising:
forming a dielectric layer comprised of the dielectric material,
wherein a portion of the dielectric material of the dielectric layer is located between the first linear feature and the first row of contacts.
17. The method of claim 15 wherein a first space between the first linear feature and the second row of contacts is free of additional linear features of the conductor and additional rows of contacts.
18. The method of claim 17 wherein the first space comprises a first area, and the first linear feature and the first row of contacts occupy a second space having a second area equal to the first area.
19. The method of claim 15 further comprising:
forming a first pad coupled with the first linear feature;
forming a second pad coupled with the first row of contacts; and
forming a third pad coupled with the second row of contacts,
wherein the second pad and the third pad are coupled in parallel.
20. The method of claim 15 wherein the first linear feature comprises polysilicon for a gate of a field-effect transistor, and further comprising:
forming a dielectric layer comprised of the dielectric material; and
forming a plurality of vias in the dielectric material,
wherein a first portion of the dielectric material of the dielectric layer is located between the first linear feature and the first row of contacts, and the first plurality of contacts in the first row of contacts comprise the conductive material deposited in the vias.