IP Library Granted Patent US 10,134,664
Granted Patent B2
US 10,134,664 · App. 15/433,866 · Granted Nov 20, 2018

Integrated circuit packaging system with embedded pad on layered substrate and method of manufacture thereof

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Quick Facts
Patent No.
US 10,134,664
App. No.
15/433,866
Granted
Nov 20, 2018
Kind
B2
Abstract

An integrated circuit packaging system and method of manufacture thereof includes: a dielectric core having an embedded pad; a top solder resist layer on the dielectric core, a pad top surface of the embedded pad below the top solder resist layer; a device interconnect attached to the embedded pad; and an integrated circuit device having an interconnect pillar, the interconnect pillar attached to the device interconnect for mounting the integrated circuit device to the dielectric core.

Claims (28)

1. A method of manufacture of an integrated circuit packaging system comprising:

forming a dielectric core having an embedded pad and a surface trace with a width of the surface trace less than a width of the embedded pad;

forming a top solder resist layer on the dielectric core, a pad top surface of the embedded pad below the top solder resist layer, a mounting region of the dielectric core exposed from the top solder resist layer, and a top trace surface of the surface trace coplanar with a core top side of the dielectric core and the pad top surface within the mounting region;

forming a device interconnect on the embedded pad; and

mounting an integrated circuit device having an interconnect pillar, the interconnect pillar attached to the device interconnect for mounting the integrated circuit device to the dielectric core.

2. The method as claimed in claim 1 wherein forming the dielectric core includes forming the embedded pad having a width of 35 μm and the surface trace having a width of 15 μm.

3. The method as claimed in claim 1 wherein forming the dielectric core includes forming the surface trace below the top solder resist layer.

4. The method as claimed in claim 1 wherein forming the dielectric core includes forming the surface trace below the core top side of the dielectric core.

5. The method as claimed in claim 1 wherein forming the dielectric core includes forming a system pad on a core bottom side of the dielectric core.

6. The method as claimed in claim 1 wherein forming the dielectric core includes forming the dielectric core having the surface trace between the embedded pad and another embedded pad, the surface trace and the embedded pad exposed from the dielectric core within the mounting region.

7. The method as claimed in claim 6 wherein forming the dielectric core includes forming the embedded pad below the core top side of the dielectric core.

8. The method as claimed in claim 6 wherein forming the dielectric core includes forming the embedded pad coplanar with the surface trace.

9. The method as claimed in claim 6 wherein forming the dielectric core includes forming the surface trace at the core top side of the dielectric core.

10. The method as claimed in claim 6 further comprising mounting an external interconnect on the core bottom side of the dielectric core.

11. An integrated circuit packaging system comprising:

a dielectric core having an embedded pad and a surface trace, a width of the surface trace less than a width of the embedded pad;

a top solder resist layer on the dielectric core, a pad top surface of the embedded pad below the top solder resist layer, a mounting region of the dielectric core exposed from the top solder resist layer, and a top trace surface of the surface trace coplanar with a core top side of the dielectric core and the pad top surface within the mounting region;

a device interconnect on the embedded pad; and

an integrated circuit device having an interconnect pillar, the interconnect pillar attached to the device interconnect for mounting the integrated circuit device to the dielectric core.

12. The system as claimed in claim 11 wherein the dielectric core includes the embedded pad having a width of 35 μm and the surface trace having a width of 15 μm.

13. The system as claimed in claim 11 wherein the dielectric core includes the surface trace below the top solder resist layer.

14. The system as claimed in claim 11 wherein the dielectric core includes the surface trace below the core top side of the dielectric core.

15. The system as claimed in claim 11 wherein the dielectric core includes a system pad on a core bottom side of the dielectric core.

16. The system as claimed in claim 11 wherein the dielectric core includes the surface trace between the embedded pad and another embedded pad in the mounting region, the surface trace between the embedded pad and the another embedded pad, the surface trace and the embedded pad exposed from the dielectric core within the mounting region.

17. The system as claimed in claim 16 the dielectric core includes the embedded pad below the core top side of the dielectric core.

18. The system as claimed in claim 16 wherein the dielectric core includes the embedded pad coplanar with the surface trace.

19. The system as claimed in claim 16 wherein the dielectric core includes the surface trace at the core top side of the dielectric core.

20. The system as claimed in claim 16 further comprising an external interconnect on the core bottom side of the dielectric core.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 3, 2025
From: STATS CHIPPAC PTE. LTD.
To: STATS CHIPPAC MANAGEMENT PTE. LTD.
Reel/Frame 072788/0917 →
CHANGE OF NAME Recorded Jul 27, 2018
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTD.
Reel/Frame 046642/0069 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 17, 2018
From: KANG, MINKYUNG; ROH, YOUNGDAL; JEON, DONG JU; PARK, KYOUNGHEE
To: STATS CHIPPAC LTD.
Reel/Frame 046374/0728 →