IP Library Patent Application 16949894
Patent Application
App. No. 16/949,894

DIRECT-COOLING FOR SEMICONDUCTOR DEVICE MODULES

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Quick Facts
Patent No.
US None
App. No.
16/949,894
Filed
Nov 19, 2020
Art Unit
2818
USPC
257/717
Abstract

In a general aspect, an apparatus can include a metal layer disposed on a surface of the substrate. The apparatus can also include a recess formed in the metal layer and a cooling fin coupled with the metal layer. A portion of the cooling fin can be disposed within the recess.

Claims (56)

1 . An apparatus, comprising:

a substrate;

a metal layer disposed on a surface of the substrate;

a recess formed in the metal layer; and

a cooling fin coupled with the metal layer, a portion of the cooling fin being disposed within the recess.

2 . The apparatus of claim 1 , wherein:

the metal layer has a thickness; and

the recess has a depth in the metal layer, the depth being less than the thickness.

3 . The apparatus of claim 2 , wherein the depth is seventy percent of the thickness.

4 . The apparatus of claim 2 , wherein:

the thickness is in a range of 0.2 to 2 millimeters (mm); and

the depth is in a range of 0.14 to 1.4 mm.

5 . The apparatus of claim 1 , wherein the recess is a first recess and the cooling fin is a folded cooling fin, the apparatus further comprising:

one or more other recesses formed in the metal layer, respective portions of the folded cooling fin being disposed in the one or more other recesses and coupled with the metal layer.

6 . The apparatus of claim 1 , wherein the recess is a first recess and the cooling fin is a first cooling fin, the apparatus further comprising:

a second recess formed in the metal layer; and

a second cooling fin coupled with the metal layer, a portion of the second cooling fin being disposed within the second recess.

7 . The apparatus of claim 6 , wherein:

the first cooling fin is a first cooling fin pin; and

the second cooling fin is a second cooling fin pin.

8 . The apparatus of claim 6 , wherein:

the first cooling fin is a first cooling fin plate; and

the second cooling fin is a second cooling fin plate.

9 . The apparatus of claim 1 , further comprising a thermally conductive adhesive disposed in the recess, the thermally conductive adhesive thermally coupling the cooling fin to the metal layer.

10 . An apparatus, comprising:

a substrate;

a semiconductor die coupled with a first surface of the substrate;

a metal layer disposed on a second surface of the substrate, the second surface being opposite the first surface;

a recess formed in the metal layer; and

a cooling fin coupled with the metal layer, a portion of the cooling fin being disposed within the recess.

11 . The apparatus of claim 10 , further comprising a thermally conductive adhesive disposed in the recess, the thermally conductive adhesive thermally coupling the cooling fin to the metal layer, the thermally conductive adhesive including at least one of solder, epoxy, or sinter.

12 . The apparatus of claim 10 , wherein:

the metal layer has a thickness; and

the recess has a depth in the metal layer, the depth being seventy percent of the thickness.

13 . The apparatus of claim 12 , wherein the thickness is in a range of 0.2 to 2 millimeters.

14 . The apparatus of claim 10 , wherein the recess is a first recess and the cooling fin is a folded cooling fin, the apparatus further comprising:

one or more other recesses formed in the metal layer, respective portions of the folded cooling fin being disposed in the one or more other recesses and coupled with the metal layer.

15 . The apparatus of claim 10 , wherein the recess is a first recess and the cooling fin is a first cooling fin, the apparatus further comprising:

a second recess formed in the metal layer; and

a second cooling fin coupled with the metal layer, a portion of the second cooling fin being disposed within the second recess.

16 . The apparatus of claim 15 , wherein:

the first cooling fin is a first cooling fin pin; and

the second cooling fin is a second cooling fin pin.

17 . The apparatus of claim 15 , wherein:

the first cooling fin is a first cooling fin plate; and

the second cooling fin is a second cooling fin plate.

18 . A method comprising:

forming a recess in a metal layer disposed on a substrate;

depositing a thermally conductive adhesive in the recess;

placing a cooling fin in the thermally conductive adhesive, such that a portion of the cooling fin is disposed in the thermally conductive adhesive disposed in the recess; and

curing the thermally conductive adhesive to couple the cooling fin with the metal layer.

19 . The method of claim 18 , wherein the metal layer has a thickness, and the forming the recess in the metal layer includes etching the recess to a depth in the metal layer, the depth being less than the thickness.

20 . The method of claim 18 , wherein the recess is a first recess, the method further comprising:

forming at least one other recess;

depositing the thermally conductive adhesive in the at least one other recess; and

prior to curing the thermally conductive adhesive, placing a respective cooling fin in the thermally conductive adhesive in the at least one other recess, such that a portion of the respective cooling fin is disposed in the thermally conductive adhesive disposed in the at least one other recess.

Assignments (3)
RELEASE OF SECURITY INTEREST IN PATENTS PREVIOUSLY RECORDED AT REEL 055315, FRAME 0350 Recorded Aug 17, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064618/0881 →
SECURITY INTEREST Recorded Feb 17, 2021
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 055315/0350 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 2, 2021
From: EOM, JOOYANG; IM, SEUNGWON; LEE, BYOUNGOK; YOO, INPIL
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 055109/0574 →