IP Library Granted Patent US 12,398,293
Granted Patent B2
US 12,398,293 · App. 17/584,532 · Granted Aug 26, 2025

Composition and method for polishing boron doped polysilicon

Inventors: Brittany Johnson (Wood Dale, IL); Brian Reiss (Woodridge, IL); Alexander W. Hains (Aurora, IL); Roman A. Ivanov (Aurora, IL)
Assignee: CMC MATERIALS LLC
C09G1/02H01L21/3212
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Quick Facts
Patent No.
US 12,398,293
App. No.
17/584,532
Granted
Aug 26, 2025
Kind
B2
Abstract

The invention provides a method of chemically mechanically polishing a substrate, especially a substrate comprising boron-doped polysilicon, comprising contacting the substrate with a chemical-mechanical polishing composition comprising an abrasive selected from α-alumina, silica, and a combination thereof, ferric ion, an organic acid, or a combination thereof, and water. The invention also provides a chemical-mechanical polishing composition comprising α-alumina, a nitrogen-containing compound selected from a zwitterionic homopolymer at, a monomeric ammonium salt, and a combination thereof, an organic acid, and water. The invention further provides a chemical-mechanical polishing composition comprising silica, an organic acid, ferric ion, and water.

Claims (16)

1. A method of chemically mechanically polishing a substrate comprising:

(i) providing a substrate,

(ii) providing a polishing pad,

(iii) providing a chemical-mechanical polishing composition comprising:

(a) a silica abrasive,

(b) ferric ion, and

(c) water,

wherein the polishing composition has a pH of about 2 to about 4,

(iv) contacting the substrate with the polishing pad and the chemical-mechanical polishing composition, and

(v) moving the polishing pad and the chemical mechanical polishing composition relative to the substrate to abrade at least a portion of a surface of the substrate to thereby polish the substrate, wherein the substrate comprises at least one layer of boron-doped polysilicon on a surface of the substrate, and wherein at least a portion of the boron-doped polysilicon on the surface of the substrate is abraded to polish the substrate.

2. The method of claim 1 , wherein the polishing composition comprises about 1 wt. % to about 5 wt. % of the silica abrasive.

3. The method of claim 2 , wherein the silica abrasive comprises particles having an average particle size of about 40 nm to about 200 nm.

4. The method of claim 2 , wherein the polishing composition comprises about 0.01 wt. % to about 1 wt. % of ferric ion.

5. The method of claim 2 , wherein the polishing composition further comprises an organic acid selected from maleic acid, L-ascorbic acid, picolinic acid, malonic acid, and combinations thereof.

6. The method of claim 5 , wherein the organic acid is maleic acid, and wherein the polishing composition comprises about 1 mM to about 100 mM of maleic acid.

7. The method of claim 1 , wherein the substrate further comprises at least one layer of silicon oxide on a surface of the substrate, and wherein at least a portion of the silicon oxide on a surface of the substrate is abraded to polish the substrate.

Assignments (4)
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 26, 2022
From: JOHNSON, BRITTANY; REISS, BRIAN; HAINS, ALEXANDER W.; IVANOV, ROMAN A.
To: CMC MATERIALS, INC.
Reel/Frame 058771/0070 →
Continuity (2)
Provisional Application 63141650 · Jan 26, 2021
Related Publication 20220235247A1 · Jul 28, 2022
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