IP Library Granted Patent US 12,211,803
Granted Patent B2
US 12,211,803 · App. 18/390,051 · Granted Jan 28, 2025

Semiconductor device and method of forming semiconductor package with RF antenna interposer having high dielectric encapsulation

Inventors: HunTeak Lee (Gyeongi-do, KR); Gwang Kim (Gyeongi-do, KR); Junho Ye (Seoul, KR); YouJoung Choi (Gyeonggi-do, KR); MinKyung Kim (Incheon, KR); Yongwoo Lee (Incheon, KR); Namgu Kim (Incheon, KR)
Assignee: STATS ChipPAC Pte. Ltd.
H01L23/552H01L21/56H01L23/3128H01L23/49816H01L23/49822H01L23/645H01L23/66H01Q1/243H01Q1/40H01L2223/6677
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Quick Facts
Patent No.
US 12,211,803
App. No.
18/390,051
Granted
Jan 28, 2025
Kind
B2
Abstract

A semiconductor device has a substrate and an electrical component disposed over a surface of the substrate. An antenna interposer is disposed over the substrate. A first encapsulant is deposited around the antenna interposer. The first encapsulant has a high dielectric constant. The antenna interposer has a conductive layer operating as an antenna and an insulating layer having a low dielectric constant less than the high dielectric constant of the first encapsulant. The antenna interposer is made from an antenna substrate having a plurality of antenna interposers. Bumps are formed over the antenna substrate and the antenna substrate is singulated to make the plurality of antenna interposers. A second encapsulant is deposited over the electrical component. The second encapsulant has a low dielectric constant less than the high dielectric constant of the first encapsulant. A shielding layer is disposed over the second encapsulant.

Claims (46)

1. A semiconductor device, comprising:

a substrate;

an electrical component disposed over a first surface of the substrate;

a first encapsulant deposited over the electrical component;

a shielding layer disposed over the first encapsulant; and

an antenna interposer disposed over a second surface of the substrate opposite the first surface of the substrate, wherein the antenna interposer is a unitary body substantially covering the substrate.

2. The semiconductor device of claim 1 , further including

a second encapsulant deposited over the antenna interposer.

3. The semiconductor device of claim 2 , wherein the second encapsulant comprises a high dielectric constant in the range of 14 to 21.

4. The semiconductor device of claim 2 , wherein the first encapsulant comprises a low dielectric constant less than a high dielectric constant of the second encapsulant.

5. The semiconductor device of claim 2 , further including an encapsulant bump disposed over the second encapsulant.

6. A semiconductor device, comprising:

a substrate;

an antenna interposer disposed over a first surface of the substrate, wherein the antenna interposer is a unitary body substantially covering the substrate;

an electrical component disposed over a second surface of the substrate opposite the first surface of the substrate;

a first encapsulant deposited over the electrical component;

a second encapsulant deposited over the antenna interposer; and

a shielding layer disposed over the first encapsulant.

7. The semiconductor device of claim 6 , wherein the second encapsulant comprises a high dielectric constant in the range of 14 to 21.

8. The semiconductor device of claim 6 , wherein the first encapsulant comprises a low dielectric constant less than a high dielectric constant of the second encapsulant.

9. The semiconductor device of claim 6 , wherein the antenna interposer includes a conductive layer operating as an antenna and an insulating layer comprising a low dielectric constant less than a high dielectric constant of the second encapsulant.

10. The semiconductor device of claim 6 , further including an encapsulant bump disposed over the second encapsulant.

11. A method of making a semiconductor device, comprising:

providing a substrate;

disposing an electrical component over a first surface of the substrate;

disposing a shielding layer over the electrical component; and

disposing an antenna interposer over a second surface of the substrate opposite the first surface of the substrate, wherein the antenna interposer is a unitary body substantially covering the substrate.

12. The method of claim 11 , further including:

depositing a first encapsulant over the electrical component; and

depositing a second encapsulant over the antenna interposer.

13. The method of claim 12 , wherein the second encapsulant comprises a high dielectric constant in the range of 14 to 21.

14. The method of claim 12 , wherein the first encapsulant comprises a low dielectric constant less than a high dielectric constant of the second encapsulant.

15. The method of claim 12 , further including disposing an encapsulant bump over the second encapsulant.

16. The method of claim 12 , further including disposing the shielding layer disposed over the first encapsulant.

17. A method of making a semiconductor device, comprising:

providing a substrate;

disposing a shielding layer over the substrate; and

disposing an antenna interposer over a first surface of the substrate, wherein the antenna interposer is a unitary body substantially covering the substrate.

18. The method of claim 17 , further including:

disposing an electrical component over a second surface of the substrate opposite the first surface of the substrate;

depositing a first encapsulant over the electrical component; and

depositing a second encapsulant over the antenna interposer.

19. The method of claim 18 , wherein the second encapsulant comprises a high dielectric constant in the range of 14 to 21.

20. The method of claim 18 , wherein the first encapsulant comprises a low dielectric constant less than a high dielectric constant of the second encapsulant.

21. The method of claim 18 , further including disposing an encapsulant bump over the second encapsulant.

22. The method of claim 18 , further including disposing the shielding layer over the first encapsulant.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 3, 2025
From: STATS CHIPPAC PTE. LTD.
To: STATS CHIPPAC MANAGEMENT PTE. LTD.
Reel/Frame 072788/0917 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 20, 2023
From: LEE, HUNTEAK; KIM, GWANG; YE, JUNHO; CHOI, YOUJOUNG; KIM, MINKYUNG; KIM, NAMGU; LEE, YONGWOO
To: STATS CHIPPAC PTE. LTD.
Reel/Frame 065917/0756 →
Continuity (2)
Continuation 17447336 · Sep 10, 2021
Related Publication 20240128201A1 · Apr 18, 2024
References Cited (15)
US 6150456A · Lee et al. · 2000 [cited by applicant]
US 11587916B2 · Wang · 2023 [cited by examiner]
US 20040212544A1 · Pennaz · 2004 [cited by examiner]
US 20090302439A1 · Pagaila et al. · 2009 [cited by applicant]
US 20160218072A1 · Liao et al. · 2016 [cited by applicant]
US 20170346185A1 · Wang et al. · 2017 [cited by applicant]
US 20190035749A1 · Dalmia et al. · 2019 [cited by applicant]
US 20190221917A1 · Kim et al. · 2019 [cited by applicant]
US 20200135669A1 · Liang · 2020 [cited by examiner]
US 20200161252A1 · Yang · 2020 [cited by examiner]
US 20200295453A1 · Kuo · 2020 [cited by examiner]
US 20210091017A1 · Yeon · 2021 [cited by examiner]
US 20220148983A1 · Lee · 2022 [cited by examiner]
CN 110061345A · 2019 [cited by applicant]
JP 11106650 · 2020 [cited by applicant]