Time tag word line shift to reduce failed bit count spikes for edge word lines
When an open block of NAND memory is read, this places the edge word lines under a set of bias conditions that can lead to disturbs. When time tag values are stored on predefined word lines, and the predefined word line is an edge word line, this can degrade not just the user data on the word line, but also the time tag values, leading to a failed bit count spike. To address this problem, a time tag word line shift approach is introduced where, if a predetermined time tag acquisition word line is an edge word line, another word line is instead used to acquire the time tag value.
1 . A non-volatile memory system, comprising:
a control circuit configured to connect to a memory array comprising a plurality of blocks of non-volatile memory cells connected along word lines, the control circuit configured to:
receive a first plurality of pages of data;
write the first plurality of pages of data sequentially to a first set of one or more word lines of a first block of the memory array;
in response to the first set of word lines being less than all of the word lines of the first block, save a word line number for the word line of the first set written last when writing of the first plurality of pages of data sequentially;
assign one or more of the word lines of the first block for recording of time tag values during the writing of the first plurality of pages of data;
determine whether the word line number for the word line of the first set written last is one of the word lines assigned for storage of time tag values; and
during the writing of the first plurality of pages of data, record a time tag value, comprising:
in response to the word line number for the word line of the first set written last not being one of the assigned word lines, record the time tag value in one of the assigned word lines; and
in response to the word line number for the word line of the first set written last being one of the assigned word lines, record the time tag value in a word line other than one of the assigned word lines.
2 . The non-volatile memory system of claim 1 , further comprising:
a memory die comprising the memory array, wherein the control circuit is on a control die, separate from and bonded to the memory die.
3 . The non-volatile memory system of claim 1 , wherein the first block comprises a plurality of zones, each zone comprising a distinct plurality of contiguous word lines, and wherein the control circuit is further configured to:
assign a word line of each zone for recording of time tag values.
4 . The non-volatile memory system of claim 3 , wherein the control circuit is further configured to:
in response to the word line number for the word line of the first set written last being the assigned word line of a first zone, record the time tag value in a word line of the first zone other than the assigned word line of the first zone.
5 . The non-volatile memory system of claim 1 , wherein the control circuit is further configured to write the first plurality of pages of data sequentially to the first set of one or more word lines in a multi-level cell format.
6 . The non-volatile memory system of claim 5 , wherein the control circuit is further configured to write the first plurality of pages of data sequentially to the first set of one or more word lines using a foggy-fine programming algorithm.
7 . The non-volatile memory system of claim 1 , wherein the control circuit is further configured to:
perform a read operation of one or more of the first plurality of pages of data written to the first set of one or more word lines, the read operation including reading the recorded time tag value.
8 . The non-volatile memory system of claim 7 , wherein the control circuit is further configured to:
subsequent to writing the first plurality of pages of data, receive a second plurality of pages; and
write one or more of the second plurality of pages of data such that all of the word lines of the first block are programmed.
9 . The non-volatile memory system of claim 1 , further comprising:
the memory array, wherein the memory has a three dimensional NAND architecture in which NAND string extend vertically from a substrate and the word lines run horizontally across the substrate.
10 . A method, comprising:
sequentially programming a first plurality of word lines of a block of NAND memory, the first plurality of word lines being less than all of the word lines of the block;
recording a word line number of last programmed of the sequentially programmed word lines; and
concurrently with programing the first plurality of word lines of the block, writing a time tag value to one of the first plurality of word lines of the block by:
determining whether the word line number of last programmed of the sequentially programmed word lines is one of one or more predetermined word lines;
in response to the last programmed of the sequentially programmed word lines not being one of the one or more predetermined word lines, writing the time tag value to one of the predetermined word lines; and
in response to the last programmed of the sequentially programmed word lines being one of the one or more predetermined word lines, writing the time tag value to a word line of the block of NAND memory other than one of the predetermined word lines.
11 . The method of claim 10 , wherein the block comprises a plurality of zones each of a different plurality of contiguous word lines, and the one or more predetermined word lines are one predetermined word line for each of the zones.
12 . The method of claim 11 , further comprising:
in response to the last programmed of the sequentially programmed word lines being the predetermined word line of a first zone, writing the time tag value to a word line of the first zone other than the predetermined word line of the first zone.
13 . The method of claim 10 , wherein:
programming the first plurality of word lines of the block of NAND memory is a multi-level cell programming operation using a foggy-fine programming algorithm.
14 . The method of claim 10 , further comprising:
performing a read operation of one or more of the plurality of programmed word lines, the read operation including reading the time tag value.
15 . The method of claim 14 , further comprising:
subsequent to programming the first plurality of word lines of the block, programing the word lines of the block such that all of the word lines of the block are programmed.
16 . A non-volatile memory system, comprising:
a memory array comprising a plurality of blocks of non-volatile memory cells connected along word lines; and
one or more control circuits connected to the one or more of memory arrays, the one or more control circuits configured to:
sequentially program a first plurality of word lines of a first block of the memory array, the first plurality of word lines being less than all of the word lines of the block and ending with a last written word line;
write time tag values to a plurality of the first plurality of word lines, including a first predetermined word line; and
read a first one of the time tag values, where to read the first time tag value the one or more control circuits are configured to:
determine whether the first predetermined word line is the last written word line;
if the first predetermined word line is not the last written word line, read the first time tag value from the first predetermined word line; and
if the first predetermined word line is the last written word line, read the first time tag value from a word line other than the first predetermined word line.
17 . The non-volatile memory system of claim 16 , wherein, to program the first plurality of word lines, the one or more control circuits are further configured to program the first plurality of word lines of the first block in a multi-level cell programming operation using a foggy-fine programming algorithm.
18 . The non-volatile memory system of claim 16 , wherein the first block comprises a plurality of zones each of a different plurality of contiguous word lines and each of the zones having a corresponding predetermined word line, the first predetermined word line belonging to a corresponding first zone of the first block.
19 . The non-volatile memory system of claim 18 , wherein the word line other than the first predetermined word line is a word line from the first zone.
20 . The non-volatile memory system of claim 16 , wherein the one or more control circuits are further configured to:
prior to reading the first one of the time tag values, further program the word lines of the first block such that all of the word lines of the first block are programmed.