Patent Assignment
Reel/Frame 004485/0774
Assignment of Assignors Interest.
Recorded: 1985-12-05
Pages: 1
Assignor
RICHARDSON, NEIL
Executed: 1985-11-15
Assignee
FAIRCHILD CAMERA AND INSTRUMENT CORPORATION, A CORP. OF DE.
464 ELLIS STREET, MOUNTAIN VIEW, CALIFORNIA, 94042
Covered Property
(1)
Electron Beam Test Probe System for Analyzing Integrated Circuits
Patent:
4,706,019 →
Application:
06/798,592 →
Related Assignments
(5)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignors Interest.
Nov 16, 1987
From: FAIRCHILD SEMICONDUCTOR CORPORATION
To: SCHLUMBERGER SYSTEMS AND SERVICES, INC.
Reel/Frame 004821/0860 →
Assignment of Assignor's Interest
Aug 5, 1996
From: FAIRCHILD SEMICONDUCTOR CORPORATION
To: NATIONAL SEMICONDUCTOR CORPORATION
Reel/Frame 008059/0846 →
Assignment of Assignor's Interest
Aug 30, 1999
From: NATIONAL SEMICONDUCTOR CORPORATION
To: SCHLUMBERGER SYSTEMS AND SERVICES, INC.
Reel/Frame 010197/0380 →
Assignment of Assignor's Interest
Jun 23, 2003
From: SCHLUMBERGER TECHNOLOGIES, INC.
To: NPTEST, LLC
Reel/Frame 014268/0115 →
Assignment of Assignor's Interest
Oct 13, 2004
From: NPTEST, LLC
To: CREDENCE SYSTEMS CORPORATION
Reel/Frame 015242/0574 →