Patent Assignment
Reel/Frame 010364/0963
Assignment of Assignor's Interest
Recorded: 1999-11-04
Pages: 4
Assignors
RICHMOND, II, DONALD PAUL
Executed: 1999-10-22
HOANG, JOHN DINH
Executed: 1999-10-22
LOBACZ, JERZY
Executed: 1999-10-22
Assignee
AEHR TEST SYSTEMS
1667 PLYMOUTH STREET, MOUNTAIN VIEW, CALIFORNIA, 94043
Covered Property
(1)
Wafer Level Burn-in and Electrical Test System and Method
Patent:
6,562,636 →
Application:
09/353,121 →
Related Assignments
(4)
Other recorded transfers of the patent in this record — the chain of ownership.
Security Agreement
Sep 6, 2013
From: AEHR TEST SYSTEMS
To: SILICON VALLEY BANK
Reel/Frame 031171/0001 →
Release of Security Interest
Apr 13, 2015
From: SILICON VALLEY BANK
To: AEHR TEST SYSTEMS
Reel/Frame 035420/0390 →
Security Interest
Apr 14, 2015
From: AEHR TEST SYSTEMS
To: QVT FUND LP; QUINTESSENCE FUND L.P.
Reel/Frame 035424/0783 →
Release of Security Interest
Nov 5, 2019
From: QVT FUND LP; QUINTESSENCE FUND L.P.
To: AEHR TEST SYSTEMS
Reel/Frame 050928/0695 →