Patent Assignment
Reel/Frame 012725/0183
Assignment of Assignor's Interest
Recorded: 2002-03-21
Pages: 3
Assignors
PAN, CHUNG-SHIH
Executed: 2002-03-21
WANG, YI-XIANG
Executed: 2002-03-21
DESAI, ANIL
Executed: 2002-03-21
Assignee
HERMES-MICORVISION, INC.
2205-B FORTUNE DRIVE, SAN JOSE, CALIFORNIA, 95131
Covered Property
(1)
Method and System of Using a Scanning Electron Microscope in Semiconductor Wafer Inspection with Z-Stage Focus
Related Assignments
(4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Apr 19, 2004
From: CHEN, ZHONG WEI
To: HERMES-MICROVISION (TAIWAN) INC.
Reel/Frame 015225/0702 →
Corrective Coversheet to Correct the Assignor Previously Recorded on Reel 015225, Frame 0702.
Nov 10, 2004
From: HERMES-MICROVISION, INC.
To: HERMES-MICROVISION (TAIWAN) INC.
Reel/Frame 015381/0028 →
Assignment of Assignor's Interest
Dec 29, 2020
From: HERMES MICROVISION, INC.
To: HERMES MICROVISION INCORPORATED B.V.
Reel/Frame 054866/0742 →
Assignment of Assignor's Interest
Dec 29, 2020
From: HERMES MICROVISION INCORPORATED B.V.
To: ASML NETHERLANDS B.V.
Reel/Frame 054870/0156 →