IP Library › Assignment 013517/0687
Patent Assignment
Reel/Frame 013517/0687

Assignment of Assignor's Interest

Recorded: 2002-11-21 Pages: 3
Assignors
MA, DAVID SUITWAI
Executed: 2002-11-04
WANG, TAO
Executed: 2002-11-04
DIETZ, JAMES J.
Executed: 2002-11-04
REN, BING
Executed: 2002-11-04
Assignee
INFINEON TECHNOLOGIES NORTH AMERICA CORP.
1730 NORTH FIRST STREET, SAN JOSE, CALIFORNIA, 95112
Covered Property (1)
System and Method for Testing One or More Dies on a Semiconductor Wafer
Patent: 7,119,567 →
Application: 10/243,544 →
Publication: US 2004/0054951
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jan 30, 2004
From: INFINEON TECHNOLOGIES NORTH AMERICA CORP.
To: INFINEON TECHNOLOGIES AG
Reel/Frame 014292/0914 →
Assignment of Assignor's Interest Jan 13, 2010
From: INFINEON TECHNOLOGIES AG
To: QIMONDA AG
Reel/Frame 023773/0001 →
Assignment of Assignor's Interest May 8, 2015
From: QIMONDA AG
To: INFINEON TECHNOLOGIES AG
Reel/Frame 035623/0001 →
Assignment of Assignor's Interest Oct 8, 2015
From: INFINEON TECHNOLOGIES AG
To: POLARIS INNOVATIONS LIMITED
Reel/Frame 036818/0583 →