Patent Assignment
Reel/Frame 013564/0925
Assignment of Assignor's Interest
Recorded: 2002-12-12
Pages: 8
Assignors
PRETTO, MARIA GIOVANNI
Executed: 2002-11-11
PORRINI, MARIA
Executed: 2002-11-11
SCALA, ROBERTO
Executed: 2002-11-11
VORONKOV, VLADIMIR
Executed: 2002-11-11
COLLARETA, PAOLO
Executed: 2002-11-11
FALSTER, ROBERT J.
Executed: 2002-11-10
Assignee
MEMC ELECTRONIC MATERIALS, SPA
VIALE GHERZI 31, 28100 NOVARA, ITALY
Covered Property
(1)
Analytical Method to Measure Nitrogen Concentration in Single Crystal Silicon
Related Assignments
(7)
Other recorded transfers of the patent in this record — the chain of ownership.
Security Agreement
Mar 19, 2003
From: MEMC ELECTRONIC MATERIALS, INC.; MEMC PASADENA, INC.; PLASMASIL, L.L.C.; SIBOND, L.L.C.
To: CITICORP USA, INC.
Reel/Frame 013964/0378 →
Security Agreement
Apr 1, 2011
From: MEMC ELECTRONIC MATERIALS, INC.; SUNEDISON LLC; SOLAICX
To: BANK OF AMERICA, N.A.
Reel/Frame 026064/0720 →
Release of Security Interest
Dec 26, 2013
From: BANK OF AMERICA, N.A.
To: ENFLEX CORPORATION; SUN EDISON LLC; SOLAICX; SUNEDISON, INC. (F/K/A MEMC ELECTRONIC MATERIALS, INC.)
Reel/Frame 031870/0031 →
Release of Security Interest
Dec 26, 2013
From: GOLDMAN SACHS BANK USA
To: NVT, LLC; SUN EDISON LLC; SOLAICX; SUNEDISON, INC. (F/K/A MEMC ELECTRONIC MATERIALS, INC.)
Reel/Frame 031870/0092 →
Security Agreement
Jan 30, 2014
From: SUNEDISON, INC.; SOLAICX; SUN EDISON, LLC; NVT, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 032177/0359 →
Release of Security Interest
Mar 3, 2014
From: DEUTSCHE BANK AG NEW YORK BRANCH
To: NVT, LLC; SUN EDISON LLC; SOLAICX; SUNEDISON, INC.
Reel/Frame 032382/0724 →
Assignment of Assignor's Interest
Jun 7, 2018
From: SUNEDISON SEMICONDUCTOR LIMITED; MEMC JAPAN LIMITED; MEMC ELECTRONIC MATERIALS S.P.A.
To: GLOBALWAFERS CO., LTD.
Reel/Frame 046327/0001 →