IP Library › Assignment 013905/0176
Patent Assignment
Reel/Frame 013905/0176

Assignment of Assignor's Interest

Recorded: 2003-08-25 Pages: 3
Assignor
Assignee
INFINEON TECHNOLOGIES AG
ST. MARTIN STR. 53, MUNICH, 81669, GERMANY
Covered Property (1)
Method for Overlay Metrology of Low Contrast Features
Patent: 6,724,479 →
Application: 09/967,176 →
Publication: US 2003/0063278
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 28, 2001
From: ZAIDI, SHOAIB HASAN
To: INFINEON TECHNOLOGIES NORTH AMERICA CORP.
Reel/Frame 012220/0888 →
Assignment of Assignor's Interest Jan 13, 2010
From: INFINEON TECHNOLOGIES AG
To: QIMONDA AG
Reel/Frame 023773/0457 →
Assignment of Assignor's Interest May 8, 2015
From: QIMONDA AG
To: INFINEON TECHNOLOGIES AG
Reel/Frame 035623/0001 →
Assignment of Assignor's Interest Oct 8, 2015
From: INFINEON TECHNOLOGIES AG
To: POLARIS INNOVATIONS LIMITED
Reel/Frame 036818/0583 →