IP Library › Assignment 015503/0023
Patent Assignment
Reel/Frame 015503/0023

Assignment of Assignor's Interest

Recorded: 2004-12-30 Received: 2004-12-30 Pages: 14
Assignor
Assignee
EMOSYN AMERICA, INC.
1171 SONORA COURT, SUNNYVALE, CA, 94086, UNITED STATES
Covered Properties (17)
Method and Apparatus for Multi-Mode Operation in a Semiconductor Circuit
Method and Apparatus for Detecting Exposure of a Semiconductor Circuit to Ultra-Violet Light
Method and apparatus for multi-mode operation in a semiconductor circuit
Application: 10/448,944 →
Transistor Circuits for Switching High Voltages and Currents Without Causing Snapback or Breakdown
Application: 10/378,413 →
Method and Apparatus for Detecting Exposure of a Semiconductor Circuit to Ultra-Violet Light
Application: 10/378,414 →
Single Chip Embedded Microcontroller Having Multiple Non-Volatile Erasable Proms Sharing a Single High Voltage Generator
Application: 10/376,682 →
Method and Apparatus for Emulating an Electrically Erasable Programmable Read Only Memory (Eeprom) Using Non-Volatile Floating Gate Memory Cells
Application: 10/340,342 →
Method and Apparatus for Detecting an Unused State in a Semiconductor Circuit
Application: 10/339,218 →
Method and apparatus for initializing a semiconductor circuit from an external interface
Application: 10/339,223 →
Method and Apparatus for Avoiding Gated Diode Breakdown in Transistor Circuits
Application: 10/338,551 →
Transistor circuits for switching high voltages without causing snapback or breakdown
Application: 60/436,702 →
Programmable Serial Interface for a Semiconductor Circuit
Application: 10/238,757 →
Method and System for Dynamically Clocking Digital Systems Based on Power Usage
Application: 10/027,665 →
Electrically-Eraseable Programmable Read-Only Memory Having Reduced-Page-Size Program and Erase
Application: 10/022,314 →
On-Chip Method and Apparatus for Testing Semiconductor Circuits
Application: 09/809,897 →
Reduction of Data Dependent Power Supply Noise When Sensing the State of a Memory Cell
Application: 09/802,184 →
Method for Testing an Integrated Circuit Including Hardware and/or Software Parts Having a Confidential Nature
Application: 09/764,683 →