Patent Assignment
Reel/Frame 018522/0933
Assignment of Assignor's Interest
Recorded: 2006-11-15
Pages: 3
Assignor
NAKATANI, YUICHI
Executed: 2006-11-07
Assignee
ADVANCED MASK INSPECTION TECHNOLOGY INC.
1, KOMUKAI TOSHIBA-CHO, SAIWAI-KU, KAWASAKI-SHI, KANAGAWA, 212-8583, JAPAN
Covered Property
(1)
Pattern Inspection Apparatus and Method with Local Critical Dimension Error Detectability
Related Assignments
(5)
Other recorded transfers of the patent in this record — the chain of ownership.
Corporate Address Change
Jun 5, 2007
From: ADVANCED MASK INSPECTION TECHNOLOGY INC.
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 019385/0760 →
Assignment of Assignor's Interest
Sep 20, 2010
From: ADVANCED MASK INSPECTION TECHNOLOGY INC.
To: KABUSHIKI KAISHA TOSHIBA; NEC CORPORATION
Reel/Frame 025008/0164 →
Assignment of Assignor's Interest
Aug 8, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043482/0364 →
Merger and Change of Name
Aug 19, 2021
From: TOSHIBA MEMORY CORPORATION; K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 057224/0091 →
Change of Name
Aug 19, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 057224/0641 →