IP Library Assignment 018558/0762
Patent Assignment
Reel/Frame 018558/0762

Assignment of Assignor's Interest

Recorded: 2006-11-28 Pages: 3
Assignors
WANG, TA-JEN
Executed: 2006-10-20
TSAI, YUAN-CHEN
Executed: 2006-10-20
TUNG, SHIH-JAN
Executed: 2006-10-20
Assignee
POWERCHIP SEMICONDUCTOR CORP.
NO. 12, LI-HSIN RD. I, SCIENCE-BASED INDUSTRIAL PARK, HSINCHU, TAIWAN
Covered Property (1)
Method of Evaluating the Uniformity of the Thickness of the Polysilicon Gate Layer
Patent: 7,435,642 →
Application: 11/559,410 →
Publication: US 2008/0113485
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Mar 22, 2007
From: POWERCHIP SEMICONDUCTOR CORP.
To: POWERCHIP SEMICONDUCTOR CORP.; RENESAS TECHNOLOGY CORP.
Reel/Frame 019045/0616 →
Change of Name Jun 26, 2019
From: POWERCHIP SEMICONDUCTOR CORP.
To: POWERCHIP TECHNOLOGY CORPORATION
Reel/Frame 049602/0564 →
Assignment of Assignor's Interest Jul 16, 2019
From: POWERCHIP TECHNOLOGY CORPORATION
To: POWERCHIP SEMICONDUCTOR MANUFACTURING CORPORATION
Reel/Frame 049757/0575 →