Patent Assignment
Reel/Frame 019045/0616
Assignment of Assignor's Interest
Recorded: 2007-03-22
Pages: 3
Assignor
POWERCHIP SEMICONDUCTOR CORP.
Executed: 2007-02-26
Assignees
POWERCHIP SEMICONDUCTOR CORP.
NO. 12, LI-HSIN RD. I, SCIENCE-BASED INDUSTRIAL PARK,, HSINCHU, TAIWAN
RENESAS TECHNOLOGY CORP.
4-1, MARUNOUCHI 2-CHOME,CHIYODA-KU,, TOKYO, 100-6334, JAPAN
Covered Property
(1)
Method of Evaluating the Uniformity of the Thickness of the Polysilicon Gate Layer
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Nov 28, 2006
From: WANG, TA-JEN; TSAI, YUAN-CHEN; TUNG, SHIH-JAN
To: POWERCHIP SEMICONDUCTOR CORP.
Reel/Frame 018558/0762 →
Change of Name
Jun 26, 2019
From: POWERCHIP SEMICONDUCTOR CORP.
To: POWERCHIP TECHNOLOGY CORPORATION
Reel/Frame 049602/0564 →
Assignment of Assignor's Interest
Jul 16, 2019
From: POWERCHIP TECHNOLOGY CORPORATION
To: POWERCHIP SEMICONDUCTOR MANUFACTURING CORPORATION
Reel/Frame 049757/0575 →