IP Library › Assignment 019733/0312
Patent Assignment
Reel/Frame 019733/0312

Assignment of Assignor's Interest

Recorded: 2007-08-22 Pages: 11
Assignor
BANK OF AMERICA
Executed: 2007-07-31
Assignee
GENRAD, INC.
600 RIVERPARK DR., N. READING, MASSACHUSETTS, 01864
Covered Properties (39)
Method of and Apparatus for the Automatic Diagnosis of the Failure of Electrical Devices Connected to Common Bus Nodes and the Like
Patent: 4,459,693 →
Application: 06/342,902 →
Method of and Apparatus for Multiplexed Automatic Testing of Electronic Circuits and the Like
Patent: 4,620,304 →
Application: 06/710,535 →
Fast-Acting Comparison Circuit
Patent: 4,686,391 →
Application: 06/860,819 →
Method and Apparatus for Verifying Proper Placement of Integrated Circuits on Circuit Boards
Patent: 4,864,219 →
Application: 07/027,650 →
Digital Signal Synthesizer
Patent: 4,782,324 →
Application: 07/047,203 →
Method of in-Circuit Testing
Patent: 4,862,069 →
Application: 07/082,054 →
Integrated Data and Timing Circuitry for Automatic Circuit Tester
Patent: 4,901,315 →
Application: 07/177,067 →
Method and Apparatus for Identifying Defective Bus Devices
Patent: 4,951,283 →
Application: 07/216,917 →
Apparatus & Method for Circuit Board Testing
Patent: 4,977,370 →
Application: 07/280,501 →
Self-Protecting Power Bus Testing System
Patent: 4,931,742 →
Application: 07/326,966 →
Low-Dead-Time Interval Timer
Patent: 5,027,298 →
Application: 07/373,993 →
Method of Testing Control Matrices for Flat-Panel Displays
Patent: 5,057,775 →
Application: 07/518,453 →
Ground-Loop Interruption Circuit
Patent: 5,103,109 →
Application: 07/547,802 →
Method for Testing Mixed Scan and Non-Scan Circuitry
Patent: 5,172,377 →
Application: 07/578,960 →
Process for Reducing the Reflectivity of Sputtered Films
Patent: 5,128,009 →
Application: 07/621,033 →
Tester Interconnect System
Patent: 5,124,636 →
Application: 07/659,755 →
Automatic Circuit Tester Employing a Three-Dimensional Switch-Matrix Layout
Patent: 5,124,638 →
Application: 07/660,277 →
Automatic Circuit Tester with Separate Instrument and Scanner Buses
Patent: 5,101,150 →
Application: 07/660,289 →
Slip Detection During Bit-Error-Rate Measurement
Patent: 5,282,211 →
Application: 07/776,850 →
Method of Testing Control Matrices Employing Distributed Source Return
Patent: 5,243,272 →
Application: 07/882,217 →
Method for Automatic Open-Circuit Detection
Patent: 5,414,715 →
Application: 08/014,154 →
Probe for Capacitive Open-Circuit Tests
Patent: 5,426,372 →
Application: 08/100,090 →
Capacitive Open-Circuit Test Employing an Improved Threshold Determination
Patent: 5,391,993 →
Application: 08/188,385 →
Circuit-Test Fixture That Includes Shorted-Together Probes
Patent: 5,457,380 →
Application: 08/240,981 →
Adaptive Alignment Probe Fixture for Circuit Board Tester
Patent: 5,506,510 →
Application: 08/245,477 →
Simultaneous Capacitive Open-Circuit Testing
Patent: 5,486,753 →
Application: 08/302,227 →
Capacitive Open-Circuit and Short-Circuit Tests of Component Connections to Circuit Boards
Patent: 5,786,697 →
Application: 08/390,065 →
Connector for Automatic Test Equipment
Patent: 5,602,490 →
Application: 08/403,472 →
System for Detecting Faults in Connections Between Integrated Circuits and Circuit Board Traces
Patent: 5,736,862 →
Application: 08/493,399 →
Test System for Determining the Orientation of Components on a Circuit Board
Patent: 5,811,980 →
Application: 08/517,573 →
System and Method of Programming a Multistation Testing System
Patent: 5,615,219 →
Application: 08/552,141 →
Main Memory System and Checkpointing Protocol for a Fault-Tolerant Computer System Using a Read Buffer
Patent: 5,745,672 →
Application: 08/564,024 →
Hybrid Scanner for Use in an Improved Mda Tester
Patent: 5,861,743 →
Application: 08/576,008 →
Method and Apparatus for Pin Assignment in Automatic Circuit Testers
Patent: 5,548,525 →
Application: 08/580,795 →
Direct-Measurement Provision of Safe Backdrive Levels
Patent: 6,114,848 →
Application: 09/231,001 →
Circuit-Board Tester with Backdrive-Based Burst Timing
Patent: 6,175,230 →
Application: 09/231,049 →
Method and Apparatus for Asynchronous Transaction Processing
Patent: 6,138,143 →
Application: 09/239,100 →
Method and Apparatus for Load Balancing in a Distributed Object Architecture
Patent: 6,393,458 →
Application: 09/289,173 →
Method and Apparatus for Distributed Database Access
Application: 09/339,724 →
Related Assignments (25)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignors Interest. Jan 26, 1982
From: PRANG, JOSEPH A.; ROETZER, RONALD E.; SCHRAEDER, MICHAEL W.
To: GENRAD, INC.
Reel/Frame 003960/0397 →
Assignment of Assignors Interest. Mar 27, 1986
From: GENRAD, INC., A CORP OF MA.
To: BANK OF NEW ENGLAND, N.A., A NATIONAL BANKING ASSOCIATION
Reel/Frame 004536/0565 →
Assignment of Assignors Interest. May 8, 1986
From: GUDAITIS, ALGIRD M.
To: GENRAD, INC.
Reel/Frame 004554/0640 →
Assignment of Assignors Interest. Mar 19, 1987
From: PARSONS, PHILIP B.
To: GENRAD, INC.
Reel/Frame 004680/0859 →
Assignment of Assignors Interest. May 6, 1987
From: UNDERWOOD, MARCOS
To: GENRAD, INC., A CORP OF MA.
Reel/Frame 004713/0324 →
Assignment of Assignors Interest. Aug 5, 1987
From: ALBEE, ALAN J.
To: GENRAD, INC.
Reel/Frame 004751/0804 →
Assignment of Assignors Interest. Apr 4, 1988
From: HEAPS, WILLIAM I.
To: GENRAD, LTD., A BRITISH CORP.
Reel/Frame 004860/0187 →
Assignment of Assignors Interest. Sep 12, 1988
From: MASTROCOLA, ALDO; SWANSON, MARK
To: GENRAD, INC., 300 BAKER AVENUE, CONCORD, MA 01742
Reel/Frame 004953/0377 →
Assignment of Assignors Interest. Dec 6, 1988
From: ANDREWS, HAROLD G.
To: GENRAD, INC.
Reel/Frame 005003/0814 →
Assignment of Assignors Interest. Mar 22, 1989
From: KARASH, KARL; BENTZEN, STEEN
To: GENRAD, INC., 300 BAKER AVENUE, CONCORD, MA 01742
Reel/Frame 005056/0653 →
Assignment of Assignors Interest. Jun 29, 1989
From: KHAZAM, MOSES
To: GENRAD, INC.
Reel/Frame 005097/0190 →
Assignment of Assignors Interest. Jul 3, 1990
From: KHAZAM, MOSES; KARASH, KARL; SMITH, CHARLES P.; SUTO, ANTHONY J.
To: GENRAD, INC.,
Reel/Frame 005367/0433 →
Assignment of Assignors Interest. Jul 9, 1990
From: HALL, HENRY P.
To: GENRAD, INC.
Reel/Frame 005366/0462 →
Assignment of Assignors Interest. Sep 7, 1990
From: ROBINSON, GORDON D.; DESHAYES, JOHN G.
To: GENRAD, INC.
Reel/Frame 005428/0693 →
Security Interest Mar 29, 1991
From: NEW BANK OF NEW ENGLAND, N.A.
To: GENRAD, INC., A MA CORP.
Reel/Frame 005674/0103 →
Assignment of Assignors Interest. Apr 29, 1991
From: WINROTH, CALVIN S.
To: GENRAD, INC.,
Reel/Frame 005750/0468 →
Assignment of Assignors Interest. Apr 29, 1991
From: WINROTH, CALVIN S.; PINCUS, ROBERT H.
To: GENRAD, INC., 300 BAKER AVENUE, CONCORD, MA 01742
Reel/Frame 005682/0949 →
Assignment of Assignors Interest. Apr 29, 1991
From: SULLIVAN, ROBERT C.; SARGENT, BRIAN J.; PINCUS, ROBERT H.; PIETRANTONI, RUDY D.
To: GENRAD, INC.
Reel/Frame 005703/0393 →
Assignment of Assignors Interest. Oct 15, 1991
From: MANLICK, ROBERT M.; FICHTENBAUM, MATTHEW L.
To: GENRAD, INC.
Reel/Frame 005885/0467 →
Assignment of Assignors Interest. Apr 20, 1992
From: JOSWIG, HELLMUT
To: SIEMENS AKTIENGESELLSCHAFT A GERMAN CORP.
Reel/Frame 006085/0953 →
Assignment of Assignors Interest. Jul 6, 1992
From: HALL, HENRY P.; PILOTTE, PAUL R.
To: GENRAD, INC.
Reel/Frame 006203/0763 →
Assignment of Assignors Interest. Mar 22, 1993
From: HAMBLIN, MICHAEL W.; ROBINSON, GORDON D.
To: GENRAD, INC.
Reel/Frame 006503/0550 →
Assignment of Assignor's Interest Sep 13, 1993
From: FREVE, PAUL R.
To: GENRAD, INC.
Reel/Frame 006687/0340 →
Assignment of Assignor's Interest Mar 31, 1994
From: KHAZAM, MOSES; BLUMENAU, STEVEN M.
To: GENRAD, INC.
Reel/Frame 006947/0129 →
Assignment of Assignor's Interest May 11, 1994
From: BLUMENAU, STEVEN M.
To: GENRAD, INC.
Reel/Frame 006995/0189 →