IP Library › Assignment 021080/0214
Patent Assignment
Reel/Frame 021080/0214

Assignment of Assignor's Interest

Recorded: 2008-06-11 Pages: 3
Assignor
WANG, WEI-CHUNG
Executed: 2008-05-28
Assignee
INSTRUMENT TECHNOLOGY RESEARCH CENTER, NATIONAL APPLIED RESEARCH LABORATORIES
20 R&D ROAD VI, HSINCHU SCIENCE BASED INDUSTRIAL PARK, HSINCHU-CITY, TAIWAN
Covered Property (1)
Method for Whole Field Thin Film Stress Evaluation
Patent: 7,403,270 →
Application: 11/430,449 →
Publication: US 2007/0017296
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest May 9, 2006
From: HUANG, CHI HUNG; YOU, HSIEN-I; SHIH, MAO-YUAN; CHEN, CHIEN-JEN
To: INSTRUMENT TECHNOLOGY RESEARCH CENTER, NATIONAL APPLIED RESEARCH LABORATORIES
Reel/Frame 017883/0869 →
Change of Name Aug 14, 2014
From: INSTRUMENT TECHNOLOGY RESEARCH CENTER, NATIONAL APPLIED RESEARCH LABORATORIES
To: NATIONAL APPLIED RESEARCH LABORATORIES
Reel/Frame 033534/0150 →