IP Library › Assignment 033534/0150
Patent Assignment
Reel/Frame 033534/0150

Change of Name

Recorded: 2014-08-14 Pages: 4
Assignor
Assignee
NATIONAL APPLIED RESEARCH LABORATORIES
3F., NO. 106, SEC. 2, HEPING E. RD., TAIPEI CITY, 106, TAIWAN
Covered Property (1)
Method for Whole Field Thin Film Stress Evaluation
Patent: 7,403,270 →
Application: 11/430,449 →
Publication: US 2007/0017296
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest May 9, 2006
From: HUANG, CHI HUNG; YOU, HSIEN-I; SHIH, MAO-YUAN; CHEN, CHIEN-JEN
To: INSTRUMENT TECHNOLOGY RESEARCH CENTER, NATIONAL APPLIED RESEARCH LABORATORIES
Reel/Frame 017883/0869 →
Assignment of Assignor's Interest Jun 11, 2008
From: WANG, WEI-CHUNG
To: INSTRUMENT TECHNOLOGY RESEARCH CENTER, NATIONAL APPLIED RESEARCH LABORATORIES
Reel/Frame 021080/0214 →